Abstract:The application requirements of high frame rate CMOS image sensors (CIS) in the industry have not been satisfied due to the speed limitations in traditional single-slope and serial two-step analog-to-digital converters (ADCs). In this paper, a high-speed fully differential two-step ADC design method for CIS was proposed. The proposed method was based on differential ramp and time-to-digital conversion (TDC) technology. A parallel conversion mode was formed that is different from serial conversion, and the robustness of the system was ensured due to the existence of differential ramps. Aiming at the inconsistency between traditional TDC technology and single-slope ADC, a TDC technology based on level coding was proposed. The proposed technology achieves the TDC in the last clock cycle of analog-to-digital conversion, and realized a two-step conversion process at another level. This paper presents a complete circuit design, layout design, and test verification of the proposed design method based on the 55 nm 1P4M CMOS experimental platform. Under the design environment of the analog voltage of 3.3 V, the digital voltage of 1.2 V, the clock frequency of 100 MHz, and a dynamic input range of 1.6 V, this design was a 12-bit ADC with a conversion time of 480 ns, column-level power consumption of 62 μW, differential nonlinearity (DNL) of +0.6/−0.6 LSB, and integral nonlinearity (INL) of +1.2/−1.4 LSB. Furthermore, it achieved a signal-to-noise distortion ratio (SNDR) of 70.08 dB. The proposed design provided a large area array with a high frame rate, and compared with the existing advanced single-slope ADC, its conversion speed increased by more than 52%. It provides an effective solution for the implementation of high frame frequency CIS.

A Low Ripple and Fast Transient Response Charge Pump in CMOS Image Sensors

A Reconfigurable Convolution-in-Pixel CMOS Image Sensor Architecture

Design of a Sample-and-Hold Circuit for High Speed CMOS Image Sensor

An area‐effective and low‐power single‐slope ADC for DCG imaging CMOS image sensor

High-Speed Fully Differential Two-Step ADC Design Method for CMOS Image Sensor

Circuit Design of High-Dynamic-Range Image Sensor Pixel for Visual Prostheses

An Intrascene Wide Dynamic Range CMOS Image Sensor Using Dual-Gain Ramp Generator for Machine Vision Applications

Pixel design optimization of CMOS image sensor with large dynamic range and high charge transfer efficiency

A High Efficiency CMOS Charge Pump for Low Voltage Operation

Design Of A High Flexible Block-Based Computational Cmos Image Sensor

High Performance CMOS Image Sensor for Low Light Imaging

A 1/2.5 Inch Vga 400 Fps Cmos Image Sensor with High Sensitivity for Machine Vision

Simulations and Design of a Single-Photon CMOS Imaging Pixel Using Multiple Non-Destructive Signal Sampling

A Two-Tap Indirect Time-of-Flight CMOS Image Sensor With Pump Gate Modulator for Low-Power Applications

A High Full Well Capacity CMOS Image Sensor for Space Applications

A Dual-Mode CMOS Image Sensor Based on In-Pixel Frame Differencing

Low-light-level CMOS imaging sensor with CTIA and digital correlated double sampling

An Over 140 dB Dynamic Range CMOS Image Sensor Combined DCG and Logarithmic Response

A Low-Noise CMOS Image Sensor With Digital Correlated Multiple Sampling

Noise Improvement and High Dynamic Range in a CMOS Image Sensor With Shift Biasing Structure

Readout Circuit for CMOS Active Pixel Image Sensor