Childhood psychoses and their borderlands.

P. Kay,I. Kolvin

DOI: https://doi.org/10.1093/OXFORDJOURNALS.BMB.A072202

British Medical Bulletin

Abstract:

What problem does this paper attempt to address?

Investigation of Medium to High Strain Deformation Microstructures Using an Automated Electron Backscattering Pattern (EBSP) System

A. Godfrey,N. C. Krieger Lassen,D. A. Hughes,D. Juul Jensen

DOI: https://doi.org/10.1017/s1431927600021528

IF: 4.0991

1998-01-01

Microscopy and Microanalysis

Abstract:The speed of automated EBSP orientation gathering has now increased to a point where it is possible to examine large areas of deformed material at a resolution close to the length scale of the dislocation substructures involved (typically <1μm for strains of greater than ∊= l). Investigation of such deformed samples invariably gives rise to diffraction images of low quality and to many double patterns. To assist in a critical selection of the data, it is usual to store a measure of the indexing confidence for each point. Here we describe how deformed samples, which provide the appropriate range of pattern qualities, can be used to calibrate acceptance criteria for unsupervised EBSP measurements on deformation microstructures. An application in the use of such criteria is also described.Two crystals, chosen with orientations that are known to develop a well defined texture spread during deformation, were channel die deformed to a strain of ∊=1.5 (78% reduction).
A machine learning approach to map crystal orientation by optical microscopy

Mallory Wittwer,Matteo Seita

DOI: https://doi.org/10.1038/s41524-021-00688-1

IF: 12.256

2022-01-19

npj Computational Materials

Abstract:Abstract Mapping grain orientation in crystalline solids is essential to investigate the relationships between local microstructure and crystallography and interpret materials properties. One of the main techniques used to perform these studies is electron backscatter diffraction (EBSD). Due to the limited measurement throughput, however, EBSD is not suitable for characterizing samples with long-range microstructure heterogeneity, nor for building large material libraries that include numerous specimens. We present a machine learning approach for high-throughput crystal orientation mapping, which relies on the optical technique called directional reflectance microscopy. We successfully apply our method on Inconel 718 specimens produced by additive manufacturing, which exhibit complex, spatially-varying microstructures. These results demonstrate that optical orientation mapping on a metal alloy is achievable. Since our method is data-driven, it can be easily extended to different alloy systems produced using different manufacturing processes.

materials science, multidisciplinary,chemistry, physical
Processing and Interpretation of EBSD Data Gathered from Plastically Deformed Metals

A. Godfrey,O. V. Mishin,Q. Liu

DOI: https://doi.org/10.1179/174328406x130911

IF: 1.8

2006-01-01

Materials Science and Technology

Abstract:The use of electron backscattered diffraction (EBSD) for the investigation of dislocation boundary microstructures formed during plastic deformation of metals is discussed. A quantitative description is given of the angular resolution limitation in EBSD mapping. The ability of filtering using orientation averaging to improve the angular resolution of the EBSD data is then considered. Orientation filtering is tested using both simulated EBSD maps where a certain orientation noise function and level are assumed and additionally by direct comparison of EBSD and orientation measurements taken in the transmission electron microscope from the same region of a thin foil. Orientation filtering results in an improvement of data quality, but filtering can also introduce artefacts that cannot be distinguished from real microstructural features. The main limitation at present in developing specific recommendations for the use of filtering methods is that more information is required about the nature of the orientation noise at or near dislocation boundaries.
Enhanced EBSD calibration accuracy based on gradients of diffraction patterns

Qiwei Shi,Hongru Zhong,Dominique Loisnard,Lei Wang,Zhe Chen,Haowei Wang,Stéphane Roux

DOI: https://doi.org/10.1016/j.matchar.2023.113022

IF: 4.537

2023-05-24

Materials Characterization

Abstract:High-resolution electron backscatter diffraction (HR-EBSD) attracts increasing attention in materials researches, and correlating simulated and experimental diffraction patterns is a major HR-EBSD branch. However, the correlation accuracy is limited by several secondary effects generally not accounted for in pattern simulations, such as the non-uniform electron energy, Kikuchi band (K-band) asymmetry or gray level reversal. Although some of these phenomena can be simulated by Monte Carlo method and dynamical simulation, the computation is highly demanding and their effects on EBSD calibration are not systematically analyzed. Recently, it has been shown that the precise locations of K-band edges were better identified using the gradient of the diffraction patterns, in particular with the presence of K-band asymmetry. In the present study, it is proposed to use a similar strategy, in Integrated Digital Image Correlation to circumvent the systematic errors, and lack of accuracy due to these asymmetry artefacts. Gray level profiles of the K-bands are analyzed to assess the correctness of image registration. High-definition experimental EBSD datasets show that crystal orientation uncertainty improves by 0.01° when using gradients. Another evidence of the enhanced calibration accuracy is the improved continuity of the calibrated projection center position at grain boundaries by about 50%. In view of these results, it is suggested to systematically use gradients of diffraction patterns in all high-resolution EBSD analyses when correlating experimental and simulated patterns.

materials science, multidisciplinary,metallurgy & metallurgical engineering, characterization & testing
3D HR-EBSD Characterization of the plastic zone around crack tips in tungsten single crystals at the micron scale

Szilvia Kalácska,Johannes Ast,Péter Dusán Ispánovity,Johann Michler,Xavier Maeder

DOI: https://doi.org/10.1016/j.actamat.2020.09.009

IF: 9.4

2020-11-01

Acta Materialia

Abstract:High angular resolution electron backscatter diffraction (HR-EBSD) was coupled with focused ion beam (FIB) slicing to characterize the shape of the plastic zone in terms of geometrically necessary dislocations (GNDs) in W single crystal in 3 dimensions. Cantilevers of similar size with a notch were fabricated by FIB and were deformed inside a scanning electron microscope at different temperatures (21∘C, 100∘C and 200∘C) just above the micro-scale brittle-to-ductile transition (BDT). J-integral testing was performed to analyse crack growth and determine the fracture toughness. At all three temperatures the plastic zone was found to be larger close to the free surface than inside the specimen, similar to macro-scale tension tests. However, at higher temperature, the 3D shape of the plastic zone changes from being localized in front of the crack tip to a butterfly-like distribution, shielding more efficiently the crack tip and inhibiting crack propagation. A comparison was made between two identically deformed samples, which were FIB-sliced from two different directions, to evaluate the reliability of the GND density estimation by HR-EBSD. The analysis of the distribution of the Nye tensor components was used to differentiate between the types of GNDs nucleated in the sample. The role of different types of dislocations in the plastic zone is discussed and we confirm earlier findings that the micro-scale BDT of W is mainly controlled by the nucleation of screw dislocations in front of the crack tip.

materials science, multidisciplinary,metallurgy & metallurgical engineering
HR-EBSD analysis of in situ stable crack growth at the micron scale

Abdalrhaman Koko,Thorsten H. Becker,Elsiddig Elmukashfi,Nicola M. Pugno,Angus J. Wilkinson,T. James Marrow

DOI: https://doi.org/10.1016/j.jmps.2022.105173

2022-09-14

Abstract:Understanding the local fracture resistance of microstructural features. such as brittle inclusions, coatings, and interfaces at the microscale under complex loading conditions is critical for microstructure-informed design of materials. In this study, a novel approach has been formulated to decompose the J-integral evaluation of the elastic energy release rate to the three-dimensional stress intensity factors directly from experimental measurements of the elastic deformation gradient tensors of the crack field by in situ high (angular) resolution electron backscatter diffraction (HR-EBSD). An exemplar study is presented of a quasi-static crack, inclined to the observed surface, propagating on low index {hkl} planes in a (001) single crystal silicon wafer.

Materials Science
Crystallographic orientation assessment by electron backscattered diffraction

F Cléton,P H Jouneau,S Henry,M Gäumann,P A Buffat

DOI: https://doi.org/10.1002/sca.4950210402

Scanning

Abstract:With an angular orientation accuracy of at least 1 , the ability of electron backscattered diffraction (EBSD) to determine and emphasise crystallographic orientation is illustrated. Using the abilities of specially developed software for computing Euler angles derived from the scanned specimen, misorientations are pointed out with acceptable flexibility and graphic output through crystallographic orientation maps or pole figures. This ability is displayed in the particular case of laser cladding of nickel-based superalloy, a process that combines the advantages of a near net-shape manufacturing and a close control of the solidification microstructure (E-LMF: epitaxial laser metal forming).
Comparison of the dislocation density obtained by HR-EBSD and X-ray profile analysis

Szilvia Kalácska,István Groma,András Borbély,Péter Dusan Ispánovity

DOI: https://doi.org/10.1063/1.4977569

2016-10-28

Abstract:Based on the cross correlation analysis of the Kikuchi diffraction patterns high-resolution EBSD is a well established method to determine the internal stress in deformed crystalline materials. In many cases, however, the stress values obtained at the different scanning points have a large (in the order of GPa) scatter. As it was first demonstrated by Wilkinson and co-workers this is due to the long tail of the probability distribution of the internal stress ($P(\sigma)$) generated by the dislocations present in the system. According to the theoretical investigations of Groma and co-workers the tail of $P(\sigma)$ is inverse cubic with prefactor proportional to the total dislocation density $<\rho>$. In this paper we present a direct comparison of the X-ray line broadening and $P(\sigma)$ obtained by EBSD on deformed Cu single crystals. It is shown that $<\rho>$ can be determined from $P(\sigma)$. This opens new perspectives for the application of EBSD in determining mesoscale parameters in a heterogeneous sample.

Materials Science
Effective structural unit analysis in hexagonal close packed alloys -- reconstruction of parent beta microstructures & crystal orientation post processing analysis

Ruth Birch,Thomas Benjamin Britton

DOI: https://doi.org/10.48550/arXiv.2104.10648

2021-09-30

Abstract:Materials with an allotropic phase transformation can result in the formation of microstructures where grains have orientation relationships (ORs) determined by the transformation history. These microstructures influence the final material properties. In zirconium alloys, there is a solid-state body centred cubic (BCC) to hexagonal close packed (HCP) phase transformation, where the crystal orientations of the HCP phase can be related to the parent BCC structure via the Burgers orientation relationship (BOR). In the present work, we adapt a reconstruction code developed for steels which uses a Markov Chain clustering algorithm to analyse electron backscatter diffraction (EBSD) maps and apply this to the HCP and BCC BOR. This algorithm is released as open-source code (via github, as ParentBOR). The algorithm enables new post processing of the original and reconstructed data set to analyse the variants of the HCP alpha-phase that are present and understand shared crystal planes and shared lattice directions within each parent beta grain, and we anticipate that this assists in understanding the transformation related deformation properties of the final microstructure. Finally, we compare the ParentBOR code with recently released reconstruction codes implemented in MTEX to reveal differences and similarities in how the microstructure is described.

Materials Science
Characterisation of Orientation Noise during EBSP Investigation of Deformed Samples

Andrew Godfrey,G. L. Wu,Qing Liu

DOI: https://doi.org/10.4028/www.scientific.net/MSF.408-412.221

2002-01-01

Materials Science Forum

Abstract:For quantitative investigations of deformed materials using the electron back scatter pattern (EBSP) technique, the angular resolution limit of the technique, resulting in an 'orientation noise' superimposed on the measurements, still presents many problems. In order to better understand EBSP data, particularly on highly deformed samples, it is necessary to quantify the extent of the orientation noise. However unlike the case of single crystals, it is not possible to directly measure the orientation noise. Some techniques are suggested for estimating the orientation noise level for deformed samples, and examples given of cases where a quantitative knowledge of the orientation noise level can be used to assist in the design and interpretation of EBSP experiments of deformed samples.
Review on Application of Optical Scattering Spectroscopy for Elastic Wave Velocity Study on Materials in Earth's Interior]

Jian-jun Jiang,He-ping Li,Li-dong Dai,Hai-ying Hu,yueming wang,Chao-shuai Zhao

DOI: https://doi.org/10.3964/j.issn.1000-0593(2015)09-2588-08

2015-01-01

Spectroscopy and spectral analysis

Abstract:In-situ experimental results on the elastic wave velocity of Earth materials at high pressure and high temperature in combination with data from seismic observation can help to inverse the chemical composition, state and migration of materials in Earth's interior, providing an important approach to explore information of deep earth. Applying the Brillouin scattering into the Diamond Anvil Cell (DAC) to obtain the in situ elastic wave velocities of minerals, is the important approach to investigate elastic properties of Earth's Interior. With the development of DAC technology, on the one hand, the high temperature and high pressure experimental environment to simulate different layers of the earth can be achieved; on the other hand, the optical properties of DAC made many kinds of optical analysis and test methods have been widely applied in this research field. In order to gain the elastic wave velocity under high temperature and high pressure, the accurate experimental pressure and heating temperature of the sample in the cavity should be measured and calibrated first, then the scattering signal needs to dealt with, using the Brillouin frequency shift to calculate the velocity in the sample. Combined with the lattice constants obtained from X ray technique, by a solid elastic theory, all the elastic parameters of minerals can be solved. In this paper, firstly, application of methods based on optical spectrum such as Brillouin and Raman scattering in elasticity study on materials in Earth's interior, and the basic principle and research progress of them in the velocity measurement, pressure and temperature calibration are described in detail. Secondly, principle and scope of application of two common methods of spectral pressure calibration (fluorescence and Raman spectral pressure standard) are analyzed, in addition with introduce of the application of two conventional means of temperature calibration (blackbody radiation and Raman temperature scale) in temperature determination. Lastly, geophysical applications of mineral elasticity are discussed on the basis of the recent research results derive from Brillouin scattering system of wave velocities for major minerals in Earth's lower mantle (perovskite, ferropericlase, etc.), and the future research work is inspected.
Direct Visualization of Localized Vibrations at Complex Grain Boundaries

Eric R. Hoglund,De-Liang Bao,Andrew O'Hara,Thomas W. Pfeifer,Md Shafkat Bin Hoque,Sara Makarem,James M. Howe,Sokrates T. Pantelides,Patrick E. Hopkins,Jordan A. Hachtel

DOI: https://doi.org/10.48550/arXiv.2208.00309

2022-08-25

Abstract:Grain boundaries (GBs) are a prolific microstructural feature that dominates the functionality of a wide class of materials. The change in functionality at a GB is a direct result of unique local atomic arrangements, different from those in the grain, that have driven extensive experimental and theoretical studies correlating atomic-scale GB structures to macroscopic electronic, infrared-optical, and thermal properties. Here, we examine a SrTiO3 GB using atomic-resolution aberration-corrected scanning transmission electron microscopy (STEM) and ultra-high-energy-resolution monochromated electron energy-loss spectroscopy (EELS), in conjunction with density functional theory (DFT) calculations. This combination enables the direct correlation of the GB structure, composition, and chemical bonding with atomic vibrations within the GB dislocation-cores. We observe that nonstoichiometry and changes in coordination and bonding at the GB leads to a redistribution of vibrational states at the GB and its dislocation-cores relative to the bounding grains. The access to localized vibrations within GBs provided by ultrahigh spatial/spectral resolution EELS correlated with atomic coordination, bonding, and stoichiometry and validated by theory, provides a direct route to quantifying the impact of individual boundaries on macroscopic properties.

Materials Science,Mesoscale and Nanoscale Physics
Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns

Qiwei Shi,Liyao Jiao,Dominique Loisnard,Chengyi Dan,Zhe Chen,Haowei Wang,Stéphane Roux

DOI: https://doi.org/10.1016/j.matchar.2022.111909

IF: 4.537

2022-06-01

Materials Characterization

Abstract:Registering experimental and simulated electron diffraction patterns is increasingly used for advanced electron backscatter diffraction indexation (EBSD) analysis, yet the accuracy of registration is limited by several effects not accounted for in pattern simulation, such as the Kikuchi band asymmetry, gray level reversal, optical distortion and non-uniform electron energy. Though some of these phenomena can be simulated by Monte Carlo method and dynamical simulation, the computation is highly demanding and their effects on EBSD calibration are seldom analyzed. Here a simple weighting of energy for simulated diffraction pattern is proposed based on several master patterns calculated before-hand, to effectively account for the electron energy distribution. Integrated digital image correlation is alternatively applied to quantify the electron energy field and calibrate geometry parameters. A metric of the accuracy of indexed crystal orientation is proposed based on a large-area high-definition experimental EBSD acquisition on a (100)-face single crystal Si wafer. The consideration of inhomogeneous energy distribution reduces the crystal orientation discrepancy by 0.128 for the Si dataset.

materials science, multidisciplinary,metallurgy & metallurgical engineering, characterization & testing
Measuring the Burgers Vector of Dislocations with Dark-Field X-ray Microscopy

Dayeeta Pal,Yifan Wang,Ramya Gurunathan,Leora Dresselhaus-Marais

2024-05-22

Abstract:The behavior of dislocations is essential to understand material properties, but their subsurface dynamics that are representative of bulk phenomena cannot be resolved by conventional transmission electron microscopy (TEM). Dark field X-ray microscope (DFXM) was recently demonstrated to image hierarchical structures of bulk dislocations by imaging lattice distortions along the transmitted X-ray diffracted beam using an objective lens. While today's DFXM can effectively map the line vector of dislocations, it still cannot quantify the Burgers vector required to understand dislocation interactions, structures, and energies. Our study formulates a theoretical model of how DFXM images collected along specific scans can be used to directly measure the Burgers vector of a dislocation. By revisiting the "invisibility criteria" from TEM theory, we re-solve this formalism for DFXM and extend it to the geometric-optics model developed for DFXM to evaluate how the images acquired from different scans about a single {hkl} diffraction peak encode the Burgers vector within them. We demonstrate this for edge, screw, and mixed dislocations and discuss the observed symmetries. This work advances our understanding of DFXM to establish its capabilities to connect bulk experiments to dislocation theory and mechanics.

Materials Science
Measurement of Orientation Dependent Stored Energy of Deformation on A Local Scale

A Godfrey,DJ Jensen,N Hansen

2001-01-01

Abstract:It is shown that importantly, stored energy variations on a local scale within a texture component can be of a comparable magnitude to the variations in stored energy between texture components. Calculations are presented for channel die cold-deformed single crystal samples of FCC rolling texture orientations. Measurements were made in the transmission electron microscope (TEM) taking into account dislocation boundary misorientations, spacing, and morphology. It is noted also that significant errors can be introduced by not correctly considering the dislocation boundary morphology.Whilst TEM methods are more accurate, electron back-scatter pattern (EBSP) investigations are much simpler to perform. Detailed interpretation of EBSP data on deformed samples is however still complicated by problems associated with the angular and spatial resolution of the technique. The methods necessary for using EBSP data for making local stored energy calculations are discussed, and a new tool for aiding the interpretation of EBSP studies on deformed microstructures is introduced.
An iterative method for reference pattern selection in high resolution electron backscatter diffraction (HR-EBSD)

Abdalrhaman Koko,Vivian Tong,Angus J. Wilkinson,T. James Marrow

DOI: https://doi.org/10.1016/j.ultramic.2023.113705

2023-01-16

Abstract:For high (angular) resolution electron backscatter diffraction (HR-EBSD), the selection of a reference diffraction pattern (EBSP0) significantly affects the precision of the calculated strain and rotation maps. This effect was demonstrated in plastically deformed body-centred cubic and face-centred cubic ductile metals (ferrite and austenite grains in duplex stainless steel) and brittle single-crystal silicon, which showed that the effect is not only limited to measurement magnitude but also spatial distribution. An empirical relationship was then identified between the cross-correlation parameter and angular error, which was used in an iterative algorithm to identify the optimal reference pattern that maximises the precision of HR-EBSD.

Materials Science
Quantitative Study of Residual Strain and Geometrically Necessary Dislocation Density Using HR-EBSD Method

C. Zhao,X. Li

DOI: https://doi.org/10.1007/s11340-021-00741-6

IF: 2.794

2021-08-17

Experimental Mechanics

Abstract:BackgroundOptical metrology is widely used to measure materials' deformation and mechanical properties but current fundamental research requires more precise measurement of microstructure and deformation in internal materials. Electron backscattered diffraction (EBSD) technique measures crystal orientation in individual grain and high resolution EBSD (HR-EBSD) method provides information about residual strain and GND density.ObjectiveDeformation of two stainless steels Nitronic 60 and Tristelle 5183 with different proportions of ferrite and carbides are characterised.MethodsPush-release bend testing was used to provide progressive increasing bending stress in two iron-based material samples. HR-EBSD and high resolution digital image correlation (HR-DIC) methods characterised residual strain, GND density and plastic strain distributions in each sample. ResultsNitronic 60 and Tristelle 5183 were deformed and obtained 3.8% and 0.9% plastic strain Ɛxx. High GND densities distributed neighbouring grain boundaries in Nitronic 60 while high GND densities distributed around carbides, especially intragranular carbides in Tristelle 5183.ConclusionsHR-EBSD and HR-DIC quantitative characterised deformation in two iron-based alloys, grain/twin boundaries and carbides resulted in GND density increase, promoted work hardening and accumulated high residual elastic strain. Heterogeneous grain/carbide size distribution leaded to stress concentration and cause carbide decohesion and brittle fracture of sample.

mechanics,materials science, multidisciplinary, characterization & testing
Exploiting Friedel pairs to interpret scanning 3DXRD data from complex geological materials

Jean-Baptiste Jacob,Jonathan Wright,Benoît Cordonnier,François Renard

DOI: https://doi.org/10.1107/s1600576724009634

IF: 4.868

2024-11-10

Journal of Applied Crystallography

Abstract:A new processing technique for synchrotron scanning 3D X‐ray diffraction data is introduced, utilizing symmetric Bragg reflections hkl and hkl, known as Friedel pairs. This technique is designed to tackle the difficulties associated with large, highly deformed, polyphase materials, especially geological samples.The present study introduces a processing strategy for synchrotron scanning 3D X‐ray diffraction (s3DXRD) data, aimed at addressing the challenges posed by large, highly deformed, polyphase materials such as crystalline rocks. Leveraging symmetric Bragg reflections known as Friedel pairs, our method enables diffraction events to be precisely located within the sample volume. This method allows for fitting the phase, crystal structure and unit‐cell parameters at the intra‐grain scale on a voxel grid. The processing workflow incorporates several new modules, designed to (i) efficiently match Friedel pairs in large s3DXRD datasets containing up to 108 diffraction peaks; (ii) assign phases to each pixel or voxel, resolving potential ambiguities arising from overlap in scattering angles between different crystallographic phases; and (iii) fit the crystal orientation and unit cell locally on a point‐by‐point basis. We demonstrate the effectiveness of our technique on fractured granite samples, highlighting the ability of the method to characterize complex geological materials and show their internal structure and mineral composition. Additionally, we include the characterization of a metal gasket made of a commercial aluminium alloy, which surrounded the granite sample during experiments. The results show the effectiveness of the technique in recovering information about the internal texture and residual strain of materials that have undergone high levels of plastic deformation.

chemistry, multidisciplinary,crystallography
A new method for locating Kikuchi bands in electron backscatter diffraction patterns

Yongsheng Zhang,Shangqiang Fang,Chucheng Lin,Jimei Zhang,Caifen Jiang,Yi Zeng,Fuqiang Huang,Hong Miao

DOI: https://doi.org/10.1002/jemt.23373

Abstract:Electron backscatter diffraction (EBSD) device can provide crystal structure, orientation, and phase content data through analysis of EBSD patterns. The reliability and precision of these data depend on the quality of the band position and zone axes data. This study introduces a new image processing method that can accurately provide the location of Kikuchi bands and poles. In this method, pattern rotation and gray gradient calculation are employed after for the initial detection of Kikuchi lines. Hough transform and Gaussian function are used for the final definition of bands position. Based on the position of Kikuchi bands, the indices of lattice planes and zone axes can be obtained precisely and easily. Angles between zone axes are calculated using locating results. The maximum error for a single-crystal silicon sample is only 8.07%, illustrating the accuracy of this new method.
Compressive Electron Backscatter Diffraction Imaging

Zoë Broad,Alex W. Robinson,Jack Wells,Daniel Nicholls,Amirafshar Moshtaghpour,Angus I. Kirkland,Nigel D. Browning

2024-07-16

Abstract:Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite these advances, issues such as the complexity of sample preparation, relatively slow acquisition, and damage in beam-sensitive samples, still limit the quantity and quality of interpretable data that can be obtained. To mitigate these issues, here we propose a method based on the subsampling of probe positions and subsequent reconstruction of an incomplete dataset. The missing probe locations (or pixels in the image) are recovered via an inpainting process using a dictionary-learning based method called beta-process factor analysis (BPFA). To investigate the robustness of both our inpainting method and Hough-based indexing, we simulate subsampled and noisy EBSD datasets from a real fully sampled Ni-superalloy dataset for different subsampling ratios of probe positions using both Gaussian and Poisson noise models. We find that zero solution pixel detection (inpainting un-indexed pixels) enables higher quality reconstructions to be obtained. Numerical tests confirm high quality reconstruction of band contrast and inverse pole figure maps from only 10% of the probe positions, with the potential to reduce this to 5% if only inverse pole figure maps are needed. These results show the potential application of this method in EBSD, allowing for faster analysis and extending the use of this technique to beam sensitive materials.

Image and Video Processing,Materials Science

Childhood psychoses and their borderlands.

Investigation of Medium to High Strain Deformation Microstructures Using an Automated Electron Backscattering Pattern (EBSP) System

A machine learning approach to map crystal orientation by optical microscopy

Processing and Interpretation of EBSD Data Gathered from Plastically Deformed Metals

Enhanced EBSD calibration accuracy based on gradients of diffraction patterns

3D HR-EBSD Characterization of the plastic zone around crack tips in tungsten single crystals at the micron scale

HR-EBSD analysis of in situ stable crack growth at the micron scale

Crystallographic orientation assessment by electron backscattered diffraction

Comparison of the dislocation density obtained by HR-EBSD and X-ray profile analysis

Effective structural unit analysis in hexagonal close packed alloys -- reconstruction of parent beta microstructures & crystal orientation post processing analysis

Characterisation of Orientation Noise during EBSP Investigation of Deformed Samples

Review on Application of Optical Scattering Spectroscopy for Elastic Wave Velocity Study on Materials in Earth's Interior]

Direct Visualization of Localized Vibrations at Complex Grain Boundaries

Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns

Measuring the Burgers Vector of Dislocations with Dark-Field X-ray Microscopy

Measurement of Orientation Dependent Stored Energy of Deformation on A Local Scale

An iterative method for reference pattern selection in high resolution electron backscatter diffraction (HR-EBSD)

Quantitative Study of Residual Strain and Geometrically Necessary Dislocation Density Using HR-EBSD Method

Exploiting Friedel pairs to interpret scanning 3DXRD data from complex geological materials

A new method for locating Kikuchi bands in electron backscatter diffraction patterns

Compressive Electron Backscatter Diffraction Imaging