Abstract:A new method has been developed for the correction of the distortions and/or enhanced phase differentiation in Electron Backscatter Diffraction (EBSD) data. Using a multi-modal data approach, the method uses segmented images of the phase of interest (laths, precipitates, voids, inclusions) on images gathered by backscattered or secondary electrons of the same area as the EBSD map. The proposed approach then search for the best transformation to correct their relative distortions and recombines the data in a new EBSD file. Speckles of the features of interest are first segmented in both the EBSD and image data modes. The speckle extracted from the EBSD data is then meshed, and the Covariance Matrix Adaptation Evolution Strategy (CMA-ES) is implemented to distort the mesh until the speckles superimpose. The quality of the matching is quantified via a score that is linked to the number of overlapping pixels in the speckles. The locations of the points of the distorted mesh are compared to those of the initial positions to create pairs of matching points that are used to calculate the polynomial function that describes the distortion the best. This function is then applied to un-distort the EBSD data, and the phase information is inferred using the data of the segmented speckle. Fast and versatile, this method does not require any human annotation and can be applied to large datasets and wide areas. Besides, this method requires very few assumptions concerning the shape of the distortion function. It can be used for the single compensation of the distortions or combined with the phase differentiation. The accuracy of this method is of the order of the pixel size. Some application examples in multiphase materials with feature sizes down to 1 $\mu$m are presented, including Ti-6Al-4V Titanium alloy, Rene 65 and additive manufactured Inconel 718 Nickel-base superalloys.

An iterative method for reference pattern selection in high resolution electron backscatter diffraction (HR-EBSD)

Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination - accuracy and precision assessment

Enhanced EBSD calibration accuracy based on gradients of diffraction patterns

Measurement of the pattern shifts for HR-EBSD with larger lattice rotations

Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach

Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns

HR-EBSD analysis of in situ stable crack growth at the micron scale

Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation

Accurate reconstruction of EBSD datasets by a multimodal data approach using an evolutionary algorithm

Global optimization for accurate determination of EBSD pattern centers

Accuracy assessment of crystal orientation indexations by EBSD

Local Residual Stress in Partially Recrystallized Iron Characterized Using High Resolution Electron Backscatter Diffraction

Quantitative Study of Residual Strain and Geometrically Necessary Dislocation Density Using HR-EBSD Method

Correction of Electron Back-scattered Diffraction datasets using an evolutionary algorithm

Effect of sample thinning on strains and lattice rotations measured from Transmission Kikuchi diffraction in the SEM

Investigation of Medium to High Strain Deformation Microstructures Using an Automated Electron Backscattering Pattern (EBSP) System

A machine learning approach to map crystal orientation by optical microscopy

Indexation of electron diffraction patterns at grain boundaries

A new method for locating Kikuchi bands in electron backscatter diffraction patterns

Surface Patterning for Multi-Scale Strain Analysis of In-Situ Sem Mechanical Experiments

Compressive Electron Backscatter Diffraction Imaging