Abstract:Cavity BPMs are crucial for achieving submicron beam alignment in X-ray Free-Electron Lasers (XFEL), particularly in undulator sections. These monitors typically generate RF signals in the S, C, or X band regions. Due to the limitations of analog-to-digital converter's (ADC) bandwidth and sampling rates, and digital signal processing capabilities, heterodyne and homodyne receivers are often employed to down-convert the RF signal to an intermediate frequency (IF) or baseband (Zero IF) respectively before digital sampling. The digitized signal is then processed by Field Programmable Gate Array (FPGA) to get the beam position and phase information. An RF direct-sampling beam signal processor has been developed using ADCs with a bandwidth of 9 GHz and a sampling rate of 2.6 GSPS, and a powerful system-on-chip FPGA. In addition, a prototype RF module without complex down conversion devices has been designed for the SHINE (Shanghai High Repetition Rate XFEL and Extreme Light Facility) cavity BPM. The processor and the RF module make a novel RF direct sampling and processing cavity BPM electronics for SHINE. This is the first attempt to use direct sampling electronics in the C band cavity BPM system. The analog signal processing chain is greatly simplified compared to the down-conversion structure. The performance of this electronics has been analyzed and evaluated in laboratory. The amplitude relative error is 2.0×10 -4 , surpassing the required accuracy of 1×10 -3 for cavity BPM systems. The phase error is 14 femtoseconds (fs), which also meets the requirements for an RF Beam Arrival Time Monitor (BAM) system. Additionally, the paper introduces the cavity BPM signal processing algorithms and their implementation in FPGA. The processor can deliver pulse-to-pulse beam position measurement above 1MHz. The RF direct-sampling electronics represents significant advancements in cavity BPM system, large-scale application can be carried out in accelerator facilities like SHINE.

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