Electrostatic, linearity and analogue/RF performance analysis of single heterojunction GaAs HEMT
J. Naima,Mohammad A. Alim
DOI: https://doi.org/10.1007/s10854-023-11803-x
2024-01-10
Journal of Materials Science Materials in Electronics
Abstract:This study focuses on the Electrostatic, linearity, and analogue/RF parameters of a single heterojunction AlGaAs/GaAs-based high electron mobility transistor (HEMT). The device performance for multiple biases has been evaluated using different figures of merit. The Electrostatic, linearity, and analogue/RF performance have been analyzed from the on-wafer DC and RF measurements. A high ON-state current (31.72 mA) and a smaller sub-threshold swing (82.2 mV/dec) have been achieved. Parameters relating to linearities, such as g m , g m2 , g m3 , VIP 2 , VIP 3 , IIP 3 , 1-dB compression point, IMD 3 , THD and analogue/RF parameters like TGF, g ds , A v , C gs , C gd , C gg , f T and f max have been analyzed under different V ds, and excellent results have been obtained for all the bias voltages. Higher values of g m , VIP 2 , VIP 3 , IIP 3 , 1-dB compression point, and lower values of g m2 , g m3 , IMD 3 , and THD have been obtained. The RF parameters have likewise yielded significant results in a similar manner. The device is revealed to have remarkable linearity and amplifying ability upon investigating the parameters as mentioned above.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter, applied