Microstructure Evolution of Pure Tungsten after Low-Energy and High-Fluence He+ Implantation Assessed by Synchrotron Grazing Incidence X-ray Diffraction
W. J. Huang,M. Sun,J. F. Yang,W. Wen,Z. M. Xie,L. C. Zhang,R. Liu,C. A. Chen,Y. Jiang,X. P. Wang,X. B. Wu,Q. F. Fang
DOI: https://doi.org/10.1016/j.jnucmat.2020.152663
IF: 3.555
2020-01-01
Journal of Nuclear Materials
Abstract:A clear understanding on the H/He plasma implantation behavior in the plasma facing materials is a key issue to manage the implanted H/He in a future nuclear fusion reactor. In this work, the microstructure evolution of pure tungsten after low-energy (100 eV) and high-fluence (1023~1024 /m2) helium ion implantation was investigated by the synchrotron grazing incidence X-ray diffraction (S-GIXRD) and nanoindentation. Benefiting from the depth dependence of S-GIXRD and nanoindentation, it was found that the unimplanted W surface layer was composed of two zones: the compressed zone with a thickness of ~56 ± 2 nm under the top surface, which was introduced by the mechanical polishing, and the unaffected matrix. The helium implanted W surface layer was composed of four zones along the direction from the top surface to deep depth: the compressed zone with a thickness of ~46 ± 10 nm, transition zone with a thickness of ~146 ± 14 nm, expanded zone, and the matrix. The compressed zone becomes thinner after He implantation possibly owing to the formation of He-complexes. The expanded zone resulted from the helium atoms entering into the tungsten lattice, while the transition zone is a result of competition between the expanding and compressing effects.