The characteristics of Co40Fe40W10B10 thin films on glass and Si(100) substrates

Wen-Jen Liu,Yung-Huang Chang,Sin-Liang Ou,Yuan-Tsung Chen,Yi-Chen Chiang,Shu-Ching Hsu,Chun-Lin Chu

DOI: https://doi.org/10.1016/j.ijleo.2020.165905

IF: 3.1

2021-01-01

Optik

Abstract:In this study, the Co40Fe40W10B10 film was sputtered onto a substrate of glass and Si(100) with thicknesses from 10 nm to 100 nm, by using the sputtering technique. As shown in the X-ray Diffraction (XRD) patterns, the structure was amorphous when B was refined by the grain size. Under the effect of the thickness, the values of the low-frequency alternating current magnetic susceptibility (χac) increased gradually. When the optimal resonance frequency (fres) was 500 Hz, the maximum value of χac with glass/Co40Fe40W10B10 was 0.35, at a thickness at 100 nm; at 100 Hz, the maximum χac of Si(100)/Co40Fe40W10B10 was 0.15, at a thickness of 100 nm. The highest χac indicates that the spin sensitivity was maximized at an fres. Moreover, the high surface energy is resulted from high adhesive characteristics. The glass/Co40Fe40W10B10 film of 37.8 mJ/mm2 exhibited the highest surface energy, at a thickness of 40 nm, while the highest surface energy of Si(100)/Co40Fe40W10B10 was 53.1 mJ/mm2 at a thickness of 100 nm. The transmittance percentage (%) of glass/Co40Fe40W10B10 film was 30.5 %, at a thickness of 10 nm. As indicated by the results, the transmittance percentage decreased with an increasing thickness, because the thickness and interface effects inhibited the transfer of photon signals through the film, causing the optical transmittance characteristics to be affected.

optics