Solution-processed amorphous p-type Cu-Sn-I thin films for transparent Cu-Sn-I/IGZO p–n junctions

Haijuan Wu,Lingyan Liang,Xiaolong Wang,Hengbo Zhang,Jinbiao Bao,Hongtao Cao
DOI: https://doi.org/10.1063/5.0051631
IF: 4
2021-05-31
Applied Physics Letters
Abstract:P-type Cu-Sn-I thin films with different Sn contents (<i>C</i><sub>Sn</sub>) were fabricated in air via a simple and low-cost spin-coating method. Sn additive facilitates the amorphization of CuI, and a complete amorphous phase of Cu-Sn-I film is achieved at <i>C</i><sub>Sn</sub> =15%. With increasing <i>C</i><sub>Sn</sub>, the optical bandgap increases and refractive index decreases, probably due to the influence of Sn-additive on both the electronic structure and phase state of the films. The air-processed Sn-free CuI films show p-type conduction with hole mobility and a concentration of 17.3 cm<sup>2</sup>/V<sup>−1</sup> s<sup>−1</sup> and 1.1 × 10<sup>19</sup> cm<sup>−3</sup>, and an increasing trend of resistivity is observed along with a large drop in hole concentration during the Sn-inspired amorphization process. Moreover, transparent Cu-Sn-I/IGZO p–n junctions were constructed, exhibiting the optimum rectifying characteristic at <i>C</i><sub>Sn</sub> = 15% with a forward-to-reverse ratio of 6.2 × 10<sup>3</sup>.
physics, applied
What problem does this paper attempt to address?