Abstract:Electron crystallography is a unique technique for structure analysis of crystals too small to be studied by single-crystal X-ray diffraction, even using a synchrotron radiation.Many different structures including the most complicated zeolites and quasicrystal approximants have been solved by electron diffraction (ED) and high-resolution transmission electron microscopy (HRTEM) combined with crystallographic image processing.[1] Even though, electron crystallography is not widely used for structure analysis compared to X-ray diffraction.The main reasons for this are 1) dynamical scattering; 2) incomplete data and 3) the techniques are not feasible and highly skilful operators are needed.The later often requires a long and hard training period.We have developed several new methods to tackle those problems.Dynamical scattering may be reduced when the incident electron beam is tilted off the zone axes.This is achieved in precession electron diffraction (PED).We have developed a new software-based method -the digital sampling method to automatically collect a series of ED frames while the electron beam is precessed.[2]Several different post-processing strategies are developed for extracting the ED data and combining them to a PED pattern.The intensity data obtained by the digital sampling method were used for structure refinement of K 2 O⋅7Nb 2 O 5 .The data quality is shown to be comparable to, and in some cases even better than that obtained using a hardware-based electron precession device.We have combined digital electron beam rotations with goniometer tilts for collecting complete 3D electron diffraction data.[3]A 3D electron diffraction dataset with an tilt range of ± 70° can be collected automatically from a nanosized crystal on a JEOL JEM2100 TEM.More than one thousand electron diffraction patterns can be collected within 1-2 hours, with a step of 0.05° -0.1° for each ED frame.There is no need for pre-alignment of the crystal.The ED patterns are combined into a 3D reciprocal lattice, from which the unit cell parameters and space group can be determined.ED intensities of all reflections can be extracted and used for structure solution and refinement.Diffuse scattering and diffraction streaks caused by crystal defects can be quantified and used for studying the defect structures in the crystals.The power of the new methods for structure analysis is demonstrated on several inorganic structures and zeolites.The automation procedure for collection of complete 3D ED data from nano-sized crystals opens new possibilities and applications of electron diffraction for structure analysis.

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Reflective Coherent Diffraction Imaging with Binary Random Sampling and Updated Support Constraints

High-Energy X-Ray Diffraction Microscopy in Materials Science

High-energy coherent X-ray diffraction microscopy of polycrystal grains: first steps towards a multi-scale approach

Serial Electron Diffraction Data Processing with diffractem and CrystFEL

High-Resolution Scanning X-ray Diffraction Microscopy

High-energy electron diffraction and microscopy

Realistic simulation of reflection high-energy electron diffraction patterns for two-dimensional lattices using Ewald construction

The Effect of Crystal Defects on 3D High-Resolution Diffraction Peaks: A FFT-Based Method

Evaluating the grain-scale deformation behavior of a single-phase FCC high entropy alloy using synchrotron high energy diffraction microscopy

Distorted Wave Approach to Diffuse Scattering in THEED and RHEED

Imposing equilibrium on measured 3-D stress fields using Hodge decomposition and FFT-based optimization

Compressive Electron Backscatter Diffraction Imaging

Combined Hydrodynamic and Diffraction Simulations of Femtosecond X-ray Scattering from Laser-Shocked Crystals

Precession Electron Diffraction Using a Digital Sampling Method.

Application of scanning electron diffraction in the transmission electron microscope for the characterisation of dislocations in minerals

Complete 3D Electron Diffraction Data Collection - New Methods and Applications

Exploiting Friedel pairs to interpret scanning 3DXRD data from complex geological materials

Simulated TEM imaging of a heavily irradiated metal

Hollow Electron Ptychographic Diffractive Imaging

Computing virtual dark-field X-ray microscopy images of complex discrete dislocation structures from large-scale molecular dynamics simulations