Abstract:Even when aberration-corrected electron microscopy is in the ascendant, the microstructural analysis of materials faces the problems of residual aberrations, zone-axis deviation, surface damage, and irradiation damage, which not only have kept the spatial resolution of the electron microscope at about 0.5 Å for years, but also limited the reliability and accuracy of the microstructural analysis. Electron ptychography is a computational imaging method that utilizes the rich information in four-dimensional scanning transmission electron microscopy datasets to obtain high spatial resolution, phase accuracy, and dose efficiency. Recently, the information limit of microscopic imaging has reached 0.14? by local-orbital ptychography. Electron ptychography consists of two stages: data acquisition and numerical reconstruction. In the data acquisition stage, a four-dimensional scanning transmission electron microscopy dataset is formed by recording the two-dimensional diffraction patterns at each position by means of a pixelated detector during the two-dimensional scanning of the electron beam on the sample. In the numerical reconstruction stage, the amplitude and phase of the sample are retrieved from these datasets by means of suitable algorithms. In contrast to aberration correction, which reduces the effect of lens aberrations on the imaging quality, electron ptychography eliminates this effect and achieves aberration-free imaging, reproducing the true structure of the sample nearly perfectly. We briefly introduce the basic principles and algorithms of electron ptychography from the perspective of the main problems faced by the microstructure analysis of materials, and introduce the main features of electron ptychography through application examples.

Hollow Electron Ptychographic Diffractive Imaging

Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector

Towards 3D Electron Ptychographic Reconstruction

Electronvolt energy resolution with broadband ptychography

High-speed Fourier Ptychographic Microscopy for Quantitative Phase Imaging.

High-Resolution Scanning X-ray Diffraction Microscopy

Introduction to Electron Ptychography for Materials Scientists

AI-enabled high-resolution scanning coherent diffraction imaging

Cryogenic electron ptychographic single particle analysis with wide bandwidth information transfer

Exact inversion of partially coherent dynamical electron scattering for picometric structure retrieval

Electron Ptychographic Microscopy For Three-Dimensional Imaging

Electron Ptychographic Diffractive Imaging of Boron Atoms in LaB 6 Crystals

A high-performance reconstruction method for partially coherent ptychography

Four-dimensional Electron Energy-Loss Spectroscopy.

Lossy Compression of Electron Diffraction Patterns for Ptychography via Change of Basis

4D-STEM Ptychography for Electron-Beam-Sensitive Materials

Ultra-fast Digital DPC Yielding High Spatio-Temporal Resolution for Low-Dose Phase Characterisation

High-resolution 3D phase-contrast imaging beyond the depth of field limit via ptychographic multi-slice electron tomography

Solving complex nanostructures with ptychographic atomic electron tomography

Uncovering the Three-Dimensional Structure of Upconverting Core-Shell Nanoparticles with Multislice Electron Ptychography

High-resolution terahertz ptychography using divergent illumination and extrapolation algorithm