Abstract:Electron crystallography is a unique technique for structure analysis of crystals too small to be studied by single-crystal X-ray diffraction, even using a synchrotron radiation.Many different structures including the most complicated zeolites and quasicrystal approximants have been solved by electron diffraction (ED) and high-resolution transmission electron microscopy (HRTEM) combined with crystallographic image processing.[1] Even though, electron crystallography is not widely used for structure analysis compared to X-ray diffraction.The main reasons for this are 1) dynamical scattering; 2) incomplete data and 3) the techniques are not feasible and highly skilful operators are needed.The later often requires a long and hard training period.We have developed several new methods to tackle those problems.Dynamical scattering may be reduced when the incident electron beam is tilted off the zone axes.This is achieved in precession electron diffraction (PED).We have developed a new software-based method -the digital sampling method to automatically collect a series of ED frames while the electron beam is precessed.[2]Several different post-processing strategies are developed for extracting the ED data and combining them to a PED pattern.The intensity data obtained by the digital sampling method were used for structure refinement of K 2 O⋅7Nb 2 O 5 .The data quality is shown to be comparable to, and in some cases even better than that obtained using a hardware-based electron precession device.We have combined digital electron beam rotations with goniometer tilts for collecting complete 3D electron diffraction data.[3]A 3D electron diffraction dataset with an tilt range of ± 70° can be collected automatically from a nanosized crystal on a JEOL JEM2100 TEM.More than one thousand electron diffraction patterns can be collected within 1-2 hours, with a step of 0.05° -0.1° for each ED frame.There is no need for pre-alignment of the crystal.The ED patterns are combined into a 3D reciprocal lattice, from which the unit cell parameters and space group can be determined.ED intensities of all reflections can be extracted and used for structure solution and refinement.Diffuse scattering and diffraction streaks caused by crystal defects can be quantified and used for studying the defect structures in the crystals.The power of the new methods for structure analysis is demonstrated on several inorganic structures and zeolites.The automation procedure for collection of complete 3D ED data from nano-sized crystals opens new possibilities and applications of electron diffraction for structure analysis.

Precession Electron Diffraction Using a Digital Sampling Method.

Characteristics of Precession Electron Diffraction Intensities from Dynamical Simulations

Complete 3D Electron Diffraction Data Collection - New Methods and Applications

High quality electron diffraction data by precession

High-resolution scanning precession electron diffraction: Alignment and spatial resolution

Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument

Correcting for probe wandering by precession path segmentation

Unsupervised machine learning applied to scanning precession electron diffraction data

Collecting 3d Electron Diffraction Data by the Rotation Method

Quantitative Electron Diffraction for Crystal Structure Determination

Combining Precession Electron Diffraction Data with X-ray Powder Diffraction Data to Facilitate Structure Solution

Serial Electron Diffraction Data Processing with diffractem and CrystFEL

Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope

Introduction to Electron Ptychography for Materials Scientists

Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors

Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition

Multibeam Electron Diffraction

High Precision Orientation Mapping from 4D-STEM Precession Electron Diffraction data through Quantitative Analysis of Diffracted Intensities

Synchronization of scanning probe and pixelated sensor for image-guided diffraction microscopy

Towards 3D Electron Ptychographic Reconstruction

Collecting 3D Electron Diffraction Data for Crystal Structure Determination