[Tumor scintigraphy. Wegener's granuloma].

K. Machida

1976-03-01

Abstract:

What problem does this paper attempt to address?

Fluorescence emission difference with defocused surface plasmon-coupled emission microscopy.

Baoliang Ge,Liangfu Zhu,Cuifang Kuang,Douguo Zhang,Yue Fang,Ye Ma,Xu Liu

DOI: https://doi.org/10.1364/OE.23.032561

IF: 3.8

2015-01-01

Optics Express

Abstract:A novel fluorescence emission difference method is proposed to improve the lateral resolution of SPCEM without increasing instrument complexity. We discovered the profile of transverse PSF in SPCEM will dramatically change from a hollow spot to a solid spot, when the axial position of sample varies within one wavelength in the vicinity of the focal plane. The subtraction of an image whose PSF is hollow spot and an image with solid PSF will greatly enhance the resolution and contrast of SPCEM images. The mechanism of the distinctive PSF is demonstrated through basic optics theories, and the improvement of lateral resolution is verified by theoretical simulations and experimental results. It is believed that our method will stand out for its pleasant resolution enhancement and its instruments' simplicity to facilitate many biological cellular observations. (C)2015 Optical Society of America
A 3D Aligning Method for Stimulated Emission Depletion Microscopy Using Fluorescence Lifetime Distribution.

Yifan Wang,Cuifang Kuang,Shuai Li,Xiang Hao,Yingke Xu,Xu Liu

DOI: https://doi.org/10.1002/jemt.22420

2014-01-01

Microscopy Research and Technique

Abstract:Optimal resolution by stimulated emission depletion (STED) microscopy requires precise alignment of the donut‐shaped depletion focus to the excitation focus. In this article, we demonstrate that fluorescence lifetime distribution can be implemented to align the STED system. Different from the traditional aligning methods in which a scattering imaging module is often equipped, the lifetime‐based method is free from probable mismatches between the scattering mode and the fluorescent mode, drift errors caused by separate imaging and complex fitting methods. Based on this method, a spatial resolution of 38 nm by time‐gated detection has been achieved. Microsc. Res. Tech. 77:935–940, 2014. © 2014 Wiley Periodicals, Inc.
Correcting for probe wandering by precession path segmentation

Gregory Nordahl,Lewys Jones,Emil Frang Christiansen,Kasper Aas Hunnestad,Magnus Nord

DOI: https://doi.org/10.48550/arXiv.2211.11413

2022-11-21

Abstract:Precession electron diffraction has in the past few decades become a powerful technique for structure solving, strain analysis, and orientation mapping, to name a few. One of the benefits of precessing the electron beam, is increased reciprocal space resolution, albeit at a loss of spatial resolution due to an effect referred to as 'probe wandering'. Here, a new methodology of precession path segmentation is presented to counteract this effect and increase the resolution in reconstructed virtual images from scanning precession electron diffraction data. By utilizing fast pixelated electron detector technology, multiple frames are recorded for each azimuthal rotation of the beam, allowing for the probe wandering to be corrected in post-acquisition processing. Not only is there an apparent increase in the resolution of the reconstructed images, but probe wandering due to instrument misalignment is reduced, potentially easing an already difficult alignment procedure.

Instrumentation and Detectors
Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways

Xiahan Sang,Andrew R. Lupini,Jilai Ding,Sergei V. Kalinin,Stephen Jesse,Raymond R. Unocic

DOI: https://doi.org/10.1038/srep43585

IF: 4.6

2017-03-08

Scientific Reports

Abstract:Abstract Atomic-resolution imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direct correlation between atomic structure and materials functionality. The fast and precise control of the STEM probe is, however, challenging because the true beam location deviates from the assigned location depending on the properties of the deflectors. To reduce these deviations, i . e . image distortions, we use spiral scanning paths, allowing precise control of a sub-Å sized electron probe within an aberration-corrected STEM. Although spiral scanning avoids the sudden changes in the beam location (fly-back distortion) present in conventional raster scans, it is not distortion-free. “Archimedean” spirals, with a constant angular frequency within each scan, are used to determine the characteristic response at different frequencies. We then show that such characteristic functions can be used to correct image distortions present in more complicated constant linear velocity spirals, where the frequency varies within each scan. Through the combined application of constant linear velocity scanning and beam path corrections, spiral scan images are shown to exhibit less scan distortion than conventional raster scan images. The methodology presented here will be useful for in situ STEM imaging at higher temporal resolution and for imaging beam sensitive materials.

multidisciplinary sciences
High Precision Orientation Mapping from 4D-STEM Precession Electron Diffraction data through Quantitative Analysis of Diffracted Intensities

Leonardo M. Corrêa,Eduardo Ortega,Arturo Ponce,Mônica A. Cotta,Daniel Ugarte

DOI: https://doi.org/10.1016/j.ultramic.2024.113927

IF: 2.994

2024-01-25

Ultramicroscopy

Abstract:The association of scanning transmission electron microscopy (STEM) and detection of a diffraction pattern at each probe position (so-called 4D-STEM) represents one of the most promising approaches to analyze structural properties of materials with nanometric resolution and low irradiation levels. This is widely used for texture analysis of materials using automated crystal orientation mapping (ACOM). Herein, we perform orientation mapping in InP nanowires exploiting precession electron diffraction (PED) patterns acquired by an axial CMOS camera. Crystal orientation is determined at each probe position by the quantitative analysis of diffracted intensities minimizing a residue comparing experiments and simulations in analogy to x-ray structural refinement. Our simulations are based on the two-beam dynamical diffraction approximation and yield a high angular precision (∼0.03°), much lower than the traditional ACOM based on pattern matching algorithms (∼1°). We anticipate that simultaneous exploration of both spot positions and high precision crystal misorientation will allow the exploration of the whole potentiality provided by PED-based 4D-STEM for the characterization of deformation fields in nanomaterials.

microscopy
Synchronization of scanning probe and pixelated sensor for image-guided diffraction microscopy

Shahar Seifer,Michael Elbaum

DOI: https://doi.org/10.1016/j.ohx.2023.e00431

2023-05-24

HardwareX

Abstract:A 4-dimensional modality of a scanning transmission electron microscope (4D-STEM) acquires diffraction images formed by a coherent and focused electron beam scanning the specimen. Newly developed ultrafast detectors offer a possibility to acquire high throughput diffraction patterns at each pixel of the scan, enabling rapid tilt series acquisition for 4D-STEM tomography. Here we present a solution to the problem of synchronizing the electron probe scan with the diffraction image acquisition, and demonstrate on a fast hybrid-pixel detector camera (ARINA, DECTRIS). Image-guided tracking and autofocus corrections are handled by the freely-available microscope-control software SerialEM, in conjunction with a high angle annular dark field (HAADF) image acquired simultaneously. The open source SavvyScan system offers a versatile set of scanning patterns, operated by commercially available multi-channel acquisition and signal generator computer cards (Spectrum Instrumentation GmbH). Images are recorded only within a sub-region of the total field, so as to avoid spurious data collection during flyback and/or acceleration periods in the scan. Hence, the trigger of the fast camera follows selected pulses from the scan generator clock gated according to the chosen scan pattern. Software and protocol are provided for gating the trigger pulses via a microcontroller (ST Microelectronics ARM Cortex). We demonstrate the system on a standard replica grating and by diffraction imaging of a ferritin specimen.
High-Resolution Scanning X-ray Diffraction Microscopy

Pierre Thibault,Martin Dierolf,Andreas Menzel,Oliver Bunk,Christian David,Franz Pfeiffer

DOI: https://doi.org/10.1126/science.1158573

IF: 56.9

2008-07-18

Science

Abstract:Coherent diffractive imaging (CDI) and scanning transmission x-ray microscopy (STXM) are two popular microscopy techniques that have evolved quite independently. CDI promises to reach resolutions below 10 nanometers, but the reconstruction procedures put stringent requirements on data quality and sample preparation. In contrast, STXM features straightforward data analysis, but its resolution is limited by the spot size on the specimen. We demonstrate a ptychographic imaging method that bridges the gap between CDI and STXM by measuring complete diffraction patterns at each point of a STXM scan. The high penetration power of x-rays in combination with the high spatial resolution will allow investigation of a wide range of complex mesoscopic life and material science specimens, such as embedded semiconductor devices or cellular networks.

multidisciplinary sciences
Precession Electron Diffraction Using a Digital Sampling Method.

Daliang Zhang,Daniel Gruner,Peter Oleynikov,Wei Wan,Sven Hovmoller,Xiaodong Zou

DOI: https://doi.org/10.1016/j.ultramic.2010.09.008

IF: 2.994

2010-01-01

Ultramicroscopy

Abstract:A software-based method for collecting precession electron diffraction (PED) patterns is described. The PED patterns are obtained on a computer controlled transmission electron microscope. A series of electron diffraction (ED) patterns are collected as still ED frames at equal intervals, while the electron beam is precessed by one period (360°) around the optical axis. A PED pattern is obtained by combining the different ED frames, which resembles the sampling of a conventional PED pattern. Since intermediate ED frames are collected, it is possible to perform different post-processing strategies on the ED data. This can be used for geometric corrections to obtain accurate integrated intensities. The alignments and data collection are fully automated and controlled by software. The data quality is comparable to what can be achieved using specialized hardware for precession. The PED data can be used for structure solution and refinement with reasonably good R-values.
Automated crystal orientation mapping by precession electron diffraction assisted four-dimensional scanning transmission electron microscopy (4D-STEM) using a scintillator based CMOS detector

Jiwon Jeong,Niels Cautaerts,Gerhard Dehm,Christian H. Liebscher

DOI: https://doi.org/10.1017/S1431927621012538

2021-03-06

Abstract:The recent development of electron sensitive and pixelated detectors has attracted the use of four-dimensional scanning transmission electron microscopy (4D-STEM). Here, we present a precession electron diffraction assisted 4D-STEM technique for automated orientation mapping using diffraction spot patterns directly captured by an in-column scintillator based complementary metal-oxide-semiconductor (CMOS) detector. We compare the results to a conventional approach, which utilizes a fluorescent screen filmed by an external CCD camera. The high dynamic range and signal-to-noise characteristics of the detector largely improve the image quality of the diffraction patterns, especially the visibility of diffraction spots at high scattering angles. In the orientation maps reconstructed via the template matching process, the CMOS data yields a significant reduction of false indexing and higher reliability compared to the conventional approach. The angular resolution of misorientation measurement could also be improved by masking reflections close to the direct beam. This is because the orientation sensitive, weak and small diffraction spots at high scattering angle are more significant. The results show that fine details such as nanograins, nanotwins and sub-grain boundaries can be resolved with a sub-degree angular resolution which is comparable to orientation mapping using Kikuchi diffraction patterns.

Instrumentation and Detectors,Materials Science
Multidimensional Images and Aberrations in STEM

Eric R. Hoglund,Andrew R. Lupini

DOI: https://doi.org/10.1088/1674-1056/ad73b2

2024-08-30

Chinese Physics B

Abstract:Recent advances in scanning transmission electron microscopy (STEM) have led to increased development of multi-dimensional STEM imaging modalities and novel image reconstruction methods. This interest arises because the main electron lens in a modern transmission electron microscope usually has a diffraction-space information limit that is significantly better than the real-space resolution of the same lens. This state-of-affairs is sometimes shared by other scattering methods in modern physics and contributes to a broader excitement surrounding multidimensional techniques that scan a probe while recording diffraction-space images, such as ptychography and scanning nano-beam diffraction. However, the contrasting resolution in the two spaces raises the question as to what is limiting their effective performance. Here, we examine this paradox by considering the effects of aberrations in both image and diffraction planes, and likewise separate the contributions of pre- and post-sample aberrations. This consideration provides insight into aberration-measurement techniques and might also indicate improvements for super-resolution techniques.

physics, multidisciplinary
Complementary ADF-STEM: a Flexible Approach to Quantitative 4D-STEM

Bryan D Esser,Joanne Etheridge

DOI: https://doi.org/10.48550/arXiv.2206.01744

2022-06-03

Abstract:Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at length scales from the micron to sub-Ångström. The recent development and adoption of high-speed, direct electron STEM detectors has enabled diffraction patterns to be collected at each probe position, generating four-dimensional STEM (4D-STEM) datasets and opening new imaging modalities. However, the limited pixel numbers in these detectors enforce a tradeoff between angular resolution and maximum collection angle. In this paper, we describe a straightforward method for quantifying 4D-STEM data by utilizing the full flux of the electron beam, including electrons scattered beyond the limits of the detector. This enables significantly increased experimental flexibility, including the synthesis of quantitative, high-contrast complementary annular dark field (cADF) STEM images from low-angle diffraction patterns whilst maintaining high angular resolution; as well as the optimization of electron dose and the more effective use of low dynamic range detectors.

Instrumentation and Detectors,Data Analysis, Statistics and Probability
Two-Dimensional Strain Mapping with Scanning Precession Electron Diffraction: An Investigation into Data Analysis Routines

Phillip Crout,Dipanwita Chatterjee,Ingeborg Nævra Prestholdt,Tor Inge Thorsen,P. A. Midgley,Antonius T. J. van Helvoort

2023-07-03

Abstract:Scanning precession electron diffraction (SPED) is a powerful technique for investigating strain. While extensive literature exists analysing strain under high convergence angle conditions there are few systematic studies describing work based around the use of smaller convergence angles despite this being a common set-up. We fill in some of this gap in the literature by providing a workflow for both the experimental and analysis components of such experiments. Our case study investigates strained Gallium Arsenide nanowires with a modern direct electron detector and common microscope alignments. Three peak finding routines are compared and we provide both source code and raw data to allow others to reproduce our findings.

Materials Science
Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post Acquisition Data Processing, Visualisation, and Structural Characterisation

Gary W. Paterson,Robert W. H. Webster,Andrew Ross,Kirsty A. Paton,Thomas A. Macgregor,Damien McGrouther,Ian MacLaren,Magnus Nord

DOI: https://doi.org/10.1017/S1431927620024307

2020-06-23

Abstract:Fast pixelated detectors incorporating direct electron detection (DED) technology are increasingly being regarded as universal detectors for scanning transmission electron microscopy (STEM), capable of imaging under multiple modes of operation. However, several issues remain around the post acquisition processing and visualisation of the often very large multidimensional STEM datasets produced by them. We discuss these issues and present open source software libraries to enable efficient processing and visualisation of such datasets. Throughout, we provide examples of the analysis methodologies presented, utilising data from a 256$\times$256 pixel Medipix3 hybrid DED detector, with a particular focus on the STEM characterisation of the structural properties of materials. These include the techniques of virtual detector imaging; higher order Laue zone analysis; nanobeam electron diffraction; and scanning precession electron diffraction. In the latter, we demonstrate nanoscale lattice parameter mapping with a fractional precision $\le 6\times10^{-4}$ (0.06%).

Materials Science,Instrumentation and Detectors
Improving Magnetic STEM-Differential Phase Contrast Imaging using Precession

Gregory Nordahl,Magnus Nord

DOI: https://doi.org/10.1093/micmic/ozad001

2023-04-05

Abstract:Differential phase contrast in scanning transmission electron microscopy (STEM-DPC) is a technique used to image electromagnetic fields in materials. STEM-DPC is based on tracking the minute changes in the position of the bright-field disk, so any effects which cause inhomogeneities in the intensity or geometry of the disk can lead to the contrast from the electromagnetic fields to be obscured. Structural changes, like grain boundaries, thickness variations, or local crystallographic orientation, are a major cause of these inhomogeneities. In this paper, we present how precession of the STEM probe with the objective lens turned off, providing a near field-free environment for magnetic imaging, can average out nonsystematic inhomogeneities in the electron beam. The methodology was tested on a polycrystalline Fe60Al40 thin film with embedded ferromagnetic structures. The effect of precession was assessed on magnetic induction maps created by three different processing algorithms. Results demonstrate that precessed STEM-DPC with the objective lens turned off shows an improvement in the form of smoothing of the variations found in the DPC signal arising from the underlying polycrystalline background.
Enhancement of leaching copper by electro-oxidation from metal powders of waste printed circuit board.

Z. Ping,Fan Zeyun,Lin Jie,L. Qiang,Qian Guang-ren,Z. Ming

DOI: https://doi.org/10.1016/j.jhazmat.2008.11.129

IF: 13.6

2009-07-30

Journal of Hazardous Materials

Abstract:
Decoding Material Structures with Scanning Electron Diffraction Techniques

Sangmoon Yoon

DOI: https://doi.org/10.3390/cryst14030275

IF: 2.7

2024-03-15

Crystals

Abstract:Recent advancements in electron detectors and computing power have revolutionized the rapid recording of millions of 2D diffraction patterns across a grid of probe positions, known as four-dimensional scanning transmission electron microscopy (4D-STEM). These datasets serve as the foundation for innovative STEM imaging techniques like integrated center of mass (iCOM) and symmetry STEM (S-STEM). This paper delves into the application of 4D-STEM datasets for diffraction analysis. We therefore use the term scanning electron diffraction (SED) instead of 4D-STEM in this review. We comprehensively explore groundbreaking diffraction methods based on SED, structured into two main segments: (i) utilizing an atomic-scale electron probe and (ii) employing a nanoscale electron probe. Achieving an atomic-scale electron probe necessitates a significant convergence angle (α > 30 mrad), leading to interference between direct and diffracted beams, distinguishing it from its nanoscale counterpart. Additionally, integrating machine learning approaches with SED experiments holds promise in various directions, as discussed in this review. Our aim is to equip materials scientists with valuable insights for characterizing atomic structures using cutting-edge SED techniques.

materials science, multidisciplinary,crystallography
Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques

Alex W. Robinson,Amirafshar Moshtaghpour,Jack Wells,Daniel Nicholls,Miaofang Chi,Ian MacLaren,Angus I. Kirkland,Nigel D. Browning

2023-12-12

Abstract:Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed to achieve these results compared to conventional 4-D approaches requires only that a random subset of probe locations is acquired from the typical regular scanning grid, which immediately generates both higher speed and the lower fluence experimentally. We also consider downsampling of the detector, showing that oversampling is inherent within convergent beam electron diffraction (CBED) patterns, and that detector downsampling does not reduce precision but allows faster experimental data acquisition. Analysis of an experimental atomic resolution yttrium silicide data-set shows that it is possible to recover over 25dB peak signal-to-noise in the recovered phase using 0.3% of the total data.

Materials Science
Dynamical Diffraction of High-Energy Electrons Investigated by Focal Series Momentum-Resolved Scanning Transmission Electron Microscopy at Atomic Resolution.

H. L. Robert,I Lobato,F. J. Lyu,Q. Chen,S. Van Aert,D. Van Dyck,K. Mueller-Caspary

DOI: https://doi.org/10.1016/j.ultramic.2021.113425

IF: 2.994

2022-01-01

Ultramicroscopy

Abstract:We report a study of scattering dynamics in crystals employing momentum-resolved scanning transmission electron microscopy under varying illumination conditions. As we perform successive changes of the probe focus, multiple real-space signals are obtained in dependence of the shape of the incident electron wave. With support from extensive simulations, each signal is shown to be characterised by an optimum focus for which the contrast is maximum and which differs among different signals. For instance, a systematic focus mismatch is found between images formed by high-angle scattering, being sensitive to thickness and chemical composition, and the first moment in diffraction space, being sensitive to electric fields. It follows that a single recording at one specific probe focus is usually insufficient to characterise materials comprehensively. Most importantly, we demonstrate in experiment and simulation that the second moment μ20+μ02=〈p2〉 of the diffracted intensity exhibits a contrast maximum when the electron probe is focused at the top and bottom faces of the specimen, making the presented concept attractive for measuring local topography. Given the versatility of 〈p2〉, we furthermore present a detailed study of its large-angle convergence both analytically using the Mott scattering approach, and by dynamical simulations using the multislice algorithm including thermal diffuse scattering. Both approaches are in very good agreement and yield logarithmic divergence with increasing scattering angle.
Unsupervised machine learning applied to scanning precession electron diffraction data

Ben H. Martineau,Duncan N. Johnstone,Antonius T. J. van Helvoort,Paul A. Midgley,Alexander S. Eggeman

DOI: https://doi.org/10.1186/s40679-019-0063-3

2019-03-15

Advanced Structural and Chemical Imaging

Abstract:Abstract Scanning precession electron diffraction involves the acquisition of a two-dimensional precession electron diffraction pattern at every probe position in a two-dimensional scan. The data typically comprise many more diffraction patterns than the number of distinct microstructural volume elements (e.g. crystals) in the region sampled. A dimensionality reduction, ideally to one representative diffraction pattern per distinct element, may then be sought. Further, some diffraction patterns will contain contributions from multiple crystals sampled along the beam path, which may be unmixed by harnessing this oversampling. Here, we report on the application of unsupervised machine learning methods to achieve both dimensionality reduction and signal unmixing. Potential artefacts are discussed and precession electron diffraction is demonstrated to improve results by reducing the impact of bending and dynamical diffraction so that the data better approximate the case in which each crystal yields a given diffraction pattern.
Multibeam Electron Diffraction

Xuhao Hong,Steven E Zeltmann,Benjamin H Savitzky,Luis Rangel DaCosta,Alexander Mueller,Andrew M Minor,Karen Bustillo,Colin Ophus

DOI: https://doi.org/10.1017/S1431927620024770

2020-09-19

Abstract:One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged electron probe over the sample to acquire thousands or even millions of sequential diffraction images, a technique that is especially appropriate for polycrystalline samples. However, due to the large Ewald sphere of TEM, excitation of Bragg peaks can be extremely sensitive to sample tilt, varying strongly for even a few degrees of sample tilt for crystalline samples. In this paper, we present multibeam electron diffraction (MBED), where multiple probe forming apertures are used to create mutiple STEM probes, all of which interact with the sample simultaneously. We detail designs for MBED experiments, and a method for using a focused ion beam (FIB) to produce MBED apertures. We show the efficacy of the MBED technique for crystalline orientation mapping using both simulations and proof-of-principle experiments. We also show how the angular information in MBED can be used to perform 3D tomographic reconstruction of samples without needing to tilt or scan the sample multiple times. Finally, we also discuss future opportunities for the MBED method.

Materials Science,Instrumentation and Detectors,Optics

[Tumor scintigraphy. Wegener's granuloma].

Fluorescence emission difference with defocused surface plasmon-coupled emission microscopy.

A 3D Aligning Method for Stimulated Emission Depletion Microscopy Using Fluorescence Lifetime Distribution.

Correcting for probe wandering by precession path segmentation

Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways

High Precision Orientation Mapping from 4D-STEM Precession Electron Diffraction data through Quantitative Analysis of Diffracted Intensities

Synchronization of scanning probe and pixelated sensor for image-guided diffraction microscopy

High-Resolution Scanning X-ray Diffraction Microscopy

Precession Electron Diffraction Using a Digital Sampling Method.

Automated crystal orientation mapping by precession electron diffraction assisted four-dimensional scanning transmission electron microscopy (4D-STEM) using a scintillator based CMOS detector

Multidimensional Images and Aberrations in STEM

Complementary ADF-STEM: a Flexible Approach to Quantitative 4D-STEM

Two-Dimensional Strain Mapping with Scanning Precession Electron Diffraction: An Investigation into Data Analysis Routines

Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post Acquisition Data Processing, Visualisation, and Structural Characterisation

Improving Magnetic STEM-Differential Phase Contrast Imaging using Precession

Enhancement of leaching copper by electro-oxidation from metal powders of waste printed circuit board.

Decoding Material Structures with Scanning Electron Diffraction Techniques

Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques

Dynamical Diffraction of High-Energy Electrons Investigated by Focal Series Momentum-Resolved Scanning Transmission Electron Microscopy at Atomic Resolution.

Unsupervised machine learning applied to scanning precession electron diffraction data

Multibeam Electron Diffraction