Abstract:The functionality of materials is determined by their composition and microstructure, that is, the distribution and orientation of crystalline grains, grain boundaries and the defects within them. The characterisation of the material's microstructure is therefore critical for materials applications such as catalysis, energy storage and buildings. Until now, characterization techniques that map the distribution of grains, their orientation, and the presence of defects have either been limited to surface investigations, to spatial resolutions of a few hundred nanometres, or to systems of thickness around one hundred nanometres, thus requiring destructive sample preparation for measurements and preventing the study of system-representative volumes or the investigation of materials under operational conditions. Here, we present X-ray linear dichroic orientation tomography, a quantitative, non-invasive technique that allows for an intra- and inter-granular characterisation of extended polycrystalline and amorphous materials in three dimensions (3D). We present the detailed characterisation of a polycrystalline sample of vanadium pentoxide (V2O5), a key catalyst in the production of sulfuric acid. In addition to determining the nanoscale composition, we map the crystal orientation throughout the polycrystalline sample with 73 nm spatial resolution. We identify grains, as well as twist, tilt, and twin grain boundaries. We further observe the creation and annihilation of topological defects promoted by the presence of volume crystallographic defects in 3D. Our method's non-destructive and spectroscopic nature opens the door to in-operando combined chemical and microstructural investigations of functional materials, including energy and mechanical materials in existing industries, as well as quantum materials for future technologies.

Picometer-precision few-tilt ptychotomography of 2D materials

Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography

Electron ptychography of 2D materials to deep sub-ångström resolution

Detecting charge transfer at defects in 2D materials with electron ptychography

Solving complex nanostructures with ptychographic atomic electron tomography

High-Resolution Scanning X-ray Diffraction Microscopy

High-resolution 3D phase-contrast imaging beyond the depth of field limit via ptychographic multi-slice electron tomography

Atomically Resolved Imaging of Radiation-Sensitive Metal-Organic Frameworks Via Electron Ptychography

Electron Ptychographic Microscopy For Three-Dimensional Imaging

Correlating 3D atomic defects and electronic properties of 2D materials with picometer precision.

Correlating 3D Atomic Defects and Electronic Properties of 2D Materials with Picometer Precision

Near-Isotropic Sub-Ångstrom 3D Resolution Phase Contrast Imaging Achieved by End-to-End Ptychographic Electron Tomography

Reliable phase quantification in focused probe electron ptychography of thin materials

X-ray Linear Dichroic Tomography of Crystallographic and Topological Defects

Introduction to Electron Ptychography for Materials Scientists

Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector

Sub-nanometer-scale Mapping of Crystal Orientation and Depth-Dependent Structure of Dislocation Cores in SrTiO3

Electron ptychography achieves atomic-resolution limits set by lattice vibrations

Determining the 3D Atomic Coordinates and Crystal Defects in 2D Materials with Picometer Precision

Local-orbital ptychography for ultrahigh-resolution imaging