Single-shot terahertz spectrometer using a microbolometer camera

Dogeun Jang,Hanran Jin,Ki-Yong Kim
DOI: https://doi.org/10.48550/arXiv.2006.03220
2020-06-05
Abstract:We demonstrate a single-shot terahertz spectrometer consisting of a modified Mach-Zehnder interferometer and a microbolometer focal plane array. The spectrometer is simple to use and can measure terahertz field autocorrelations and spectral power with no moving parts and no ultrashort-pulsed laser. It can effectively detect radiation at 10$\sim$40 THz when tested with a thermal source. It can be also used to measure the complex refractive index of a sample material. In principle, it can characterize both laser-based and non-laser-based terahertz sources and potentially cover 1$\sim$10 THz with specially-designed terahertz microbolometers.
Instrumentation and Detectors,Optics
What problem does this paper attempt to address?
The problem that this paper attempts to solve is to develop a single - shot terahertz (THz) spectrometer, which can measure the autocorrelation and spectral power of the terahertz field without moving parts or ultrashort - pulse lasers. Specifically, the paper presents a single - shot Fourier - transform infrared (FTIR) spectrometer using a microbolometer focal - plane array (FPA), which is based on an improved Mach - Zehnder interferometer. This method can effectively detect radiation in the range of 10 to 40 THz and can be used to measure the complex refractive index of sample materials. In addition, this technique can in principle characterize laser - based and non - laser - based terahertz sources and may cover the frequency range of 1 to 10 THz through specially designed terahertz microbolometers. The paper mentions that the traditional terahertz - time - domain spectroscopy (THz - TDS) method requires multiple scans, which is not suitable for applications such as material damage and structural phase transitions in irreversible processes or applications that require real - time terahertz - field characterization. Although the electro - optic (EO) sampling technique can achieve single - shot measurement, it is limited by the dispersion and absorption properties of electro - optic materials, making it difficult to perform broadband detection, and it requires an ultrashort - pulse laser, which limits its application to non - laser - based terahertz sources. Therefore, the technique proposed in this paper aims to overcome these limitations and provide a simple, efficient terahertz - spectral - measurement scheme applicable to a wider range of scenarios.