Abstract:The dramatic improvement in photon sources such as Free Electron Lasers (FELs) and Diffraction-Limited Storage Rings (DSLRs) over the last two decades has significantly expanded the range of science that is possible at these facilities. In order to take full advantage, detectors with similarly advanced capabilities are needed. Developing such detectors, however, is extremely challenging; they typically take a decade to deploy and often require several iterations, necessitating considerable resources. Their integration in experiments is also not trivial. As a result, many experiments are still detector limited, as described by Gruner et al.. Therefore, we have solicited papers on progress in this field. This editorial includes an overview of key challenges reported by the authors and new technologies they described that help overcome them. Of course, many other developments are underway; here, we largely focus on those submitted by the authors.The development of new detectors for photon science presents several challenges. The first is to meet the well-documented (1, 2) performance increase of new FELs and DLSRs. Second, photon science detectors must accommodate a wide range of experimental operating modes (Gruner et al., Andresen et al., Armstrong et al.). Even within a single facility, detectors supporting a variety of applications are required (Graafsma et al.). They are also frequently adapted for experiments for which they were not originally optimized, and are increasingly fitted with multiple sensor types to address the need for wider X-ray energy ranges. Designing with all these possible cases in mind is difficult and time-consuming -and can lead to compromise solutions not optimised for any one experiment.The range of requirements is not entirely open-ended, as some specifications have practical limits, and advancements in radiation sources can even lead to detector consolidation. For instance, at higher photon energies, there is a sensible limit to pixel size related to absorption length of secondary particles (Frojdh et al.), and the increasing brilliance of DLSRs requires event or frame rates comparable to the CW-pulse repetition rates of future FELs, suggesting that similar detectors may be suitable for both (Graafsma et al.).Despite this convergence in frame rate requirements, however, specific needs do persist for much higher frame rates (GHz) for burst imaging (Gruner et al.) and much slower, low-noise imaging (sub-Hz) for RIXS (Andresen et al.). This, and the fact that high repetition-rate CW operation at some facilities remains a long-term project, suggests requirements will remain divergent at least in the near future.The increase in performance of modern detectors also poses challenges for downstream systems. Multimegapixel detectors with MHz frame rates generate vast quantities of data. This needs not just to be captured but calibrated and stored for many years. The calibration itself is a major task, since for some detectors the number of parameters can exceed 10 9 (Sztuk et al.). The associated difficulty can be strongly impacted by decisions taken at the detector development stage many years earlier (Pennicard et al.). The need for reproducibility of calibrations years later further adds to the complexity, since it must also be possible to apply more advanced calibrations as the understanding of an installed detector improves whilst still re-producing older results (Schmidt et al.).A "gold standard" would be an integrating sensor with single-photon resolution which could convert to photon counts and compress to the Poisson limit for ultimate data reduction with zero science loss (Frojdhet al., Pennicard et al.).When addressing these challenges, it's crucial to identify the primary bottleneck in the system, which could be anywhere from sensor to data transfer. If this bottleneck cannot be mitigated, optimizing other parts of the system for higher performance may be inefficient or unnecessary.The need for detectors to span an energy regime from 10 1 to 10 5 eV pushes both hard and soft X-ray sensor developments. For hard X-rays, in addition to GaAs, Ge, and CdTe, research into the manufacture and use Cutting-edge commercial designs and even other scientific fields use much smaller nodes (3) than the 65 nm and 110 nm used here. However, Commercial effort focuses on reducing the cost per transistor whereas for large area detector applications, the cost per area is most important, and this tends to increase as the node shrinks (4). This may eventually limit what node is used for large-area applications. In addition, Frontiers while smaller nodes are superior for digital circuitry, for analog circuits larger nodes have advantages as well. Older nodes may continue to be employed, or the use of chiplets to best match cost and performance may become more common.New CMOS functionalities beyond node size also allow improved performance. However, -Abstract Truncated-

Next-Generation Information Technology Systems for Fast Detectors in Electron Microscop

Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing and Storage

ToTEM: A Software for Fast TEM Image Simulation

Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post Acquisition Data Processing, Visualisation, and Structural Characterisation

The 4D Camera: An 87 kHz Direct Electron Detector for Scanning/Transmission Electron Microscopy

Detectors for the future of X-ray imaging

A Direct Electron Detector For Time-Resolved Mev Electron Microscopy

From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging

Towards data-driven next-generation transmission electron microscopy

Sub-100 nanosecond temporally resolved imaging with the Medipix3 direct electron detector

Status of detector development for the European XFEL

A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management

Editorial: Pushing frontiers—imaging for photon science

Fast readout of multi-channel detectors by using a CCD/CMOS camera

Toward the Development of High-Performance Direct Electron Detectors by Means of TCAD Simulations

Detector Development for the European XFEL: Requirements and Status

Development of Hybrid Pixel Detectors for MeV UED and UEM Applications

Event driven 4D STEM acquisition with a Timepix3 detector: microsecond dwell time and faster scans for high precision and low dose applications

Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy

Photon-counting x-ray detectors for CT