Microwave Properties of Superconducting Atomic-Layer Deposited TiN Films

P. C. J. J. Coumou,M. R. Zuiddam,E. F. C. Driessen,P. J. de Visser,J. J. A. Baselmans,T. M. Klapwijk
DOI: https://doi.org/10.1109/tasc.2012.2236603
IF: 1.9489
2013-06-01
IEEE Transactions on Applied Superconductivity
Abstract:We have grown superconducting TiN films by atomic layer deposition with thicknesses ranging from 6 to 89 nm. This deposition method allows us to tune the resistivity and critical temperature by controlling the film thickness. The microwave properties are measured, using a coplanar-waveguide resonator, and we find internal quality factors above a million, high sheet inductances (5.2-620 pH), and pulse response times up to 100 μs. The high normal state resistivity of the films (>; 100 μΩ · cm) affects the superconducting state and thereby the electrodynamic response. The microwave response is modeled using a quasiparticle density of states modified with an effective pair-breaker, consistently describing the measured temperature dependence of the quality factor and the resonant frequency.
physics, applied,engineering, electrical & electronic
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