Superconductivity behavior in epitaxial TiN films points at surface magnetic disorder
N. A. Saveskul,N. A. Titova,E. M. Baeva,A. V. Semenov,A. V. Lubenchenko,S. Saha,H. Reddy,S. I Bogdanov,E. E. Marinero,V. M. Shalaev,A. Boltasseva,V. S. Khrapai,A. I. Kardakova,G. N. Goltsman,N.A. Saveskul,N.A. Titova,E.M. Baeva,A.V. Semenov,A.V. Lubenchenko,S.I Bogdanov,E.E. Marinero,V.M. Shalaev,V.S. Khrapai,A.I. Kardakova,G.N. Goltsman
DOI: https://doi.org/10.48550/arXiv.1903.05009
2019-03-12
Materials Science
Abstract:We analyze the evolution of the normal and superconducting electronic properties in epitaxial TiN films, characterized by high Ioffe-Regel parameter values, as a function of the film thickness. As the film thickness decreases, we observe an increase of in the residual resistivity, which becomes dominated by diffusive surface scattering for $d\leq20\,$nm. At the same time, a substantial thickness-dependent reduction of the superconducting critical temperature is observed compared to the bulk TiN value. In such a high quality material films, this effect can be explained by a weak magnetic disorder residing in the surface layer with a characteristic magnetic defect density of $\sim10^{12}\,\mathrm{cm}^{-2}$. Our results suggest that surface magnetic disorder is generally present in oxidized TiN films.