Nanoscale Adhesion and Material Transfer at 2D MoS 2 -MoS 2 Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations

Sathwik Reddy Toom,Takaaki Sato,Zachary Milne,Rodrigo A. Bernal,Yeau-Ren Jeng,Christopher Muratore,Nicholas R. Glavin,Robert W. Carpick,J. David Schall
DOI: https://doi.org/10.1021/acsami.4c03208
IF: 9.5
2024-05-29
ACS Applied Materials & Interfaces
Abstract:Low-dimensional materials, such as MoS(2), hold promise for use in a host of emerging applications, including flexible, wearable sensors due to their unique electrical, thermal, optical, mechanical, and tribological properties. The implementation of such devices requires an understanding of adhesive phenomena at the interfaces between these materials. Here, we describe combined nanoscale in situ transmission electron microscopy (TEM)/atomic force microscopy (AFM) experiments and simulations...
materials science, multidisciplinary,nanoscience & nanotechnology
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