Epitaxial growth, structural and magnetic characterization of thulium thin films

Igor Lyalin,Katherine Robinson,Alexander J. Bishop,Gabriel Calderón Ortiz,Sadikul Alam,Jinwoo Hwang,and Roland K. Kawakami
DOI: https://doi.org/10.1103/physrevmaterials.8.054410
IF: 3.98
2024-05-14
Physical Review Materials
Abstract:Magnetic properties of bulk thulium crystals have been studied, with most works dating back to the 1960s, but to our knowledge, studies of thulium thin films are lacking. Here, we report the growth of Tm(0001) epitaxial films on SiC(0001) by means of molecular beam epitaxy. Clear Laue oscillations and narrow rocking curves in the x-ray diffraction scans indicate the high crystalline quality of the films. Magnetic circular dichroism and the anomalous Hall effect are utilized to probe magnetic properties. Periodic changes of remanent magnetization indicate a ferrimagnetic order with a period of seven monolayers along the c axis, in agreement with the ferrimagnetic properties of the bulk. The realization of Tm thin films opens the door to explore physics that could not be probed in the bulk. https://doi.org/10.1103/PhysRevMaterials.8.054410 ©2024 American Physical Society
materials science, multidisciplinary
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