Synthesis of atomically thin hexagonal boron nitride films on nickel foils by molecular beam epitaxy

S. Nakhaie,J.M. Wofford,T. Schumann,U. Jahn,M. Ramsteiner,M. Hanke,J.M.J. Lopes,H. Riechert
DOI: https://doi.org/10.1063/1.4921921
2015-05-28
Abstract:Hexagonal boron nitride (h-BN) is a layered two-dimensional material with properties that make it promising as a dielectric in various applications. We report the growth of h-BN films on Ni foils from elemental B and N using molecular beam epitaxy. The presence of crystalline h-BN over the entire substrate is confirmed by Raman spectroscopy. Atomic force microscopy is used to examine the morphology and continuity of the synthesized films. A scanning electron microscopy study of films obtained using shorter depositions offers insight into the nucleation and growth behavior of h-BN on the Ni substrate. The morphology of h-BN was found to evolve from dendritic, star-shaped islands to larger, smooth triangular ones with increasing growth temperature.
Materials Science
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