High Energy X-Ray Source Characterization at 0.450, 3, 6, 9, and 15 MVp

David Hellmann,Michael Liesenfelt,Jason P. Hayward
DOI: https://doi.org/10.1007/s10921-024-01068-7
2024-06-09
Journal of Nondestructive Evaluation
Abstract:As the availability and importance of high energy X-ray sources grows, accurate source characterizations provide critical information for field flatness corrections, beam hardening corrections, detector response corrections, and radiation shielding assessments. This study uses MCNP6.2 to create accurate high definition angular and energy dependent X-ray source definitions for the most common high energy industrial X-ray sources at 450 kVp, 3 MVp, 6 MVp, 9 MVp, and 15 MVp.
materials science, characterization & testing
What problem does this paper attempt to address?
The problem this paper attempts to address is the precise characterization of high-energy X-ray sources. Specifically, the authors used the MCNP6.2 software to create high-precision angle and energy-dependent models of common industrial high-energy X-ray sources, including 450 kVp, 3 MVp, 6 MVp, 9 MVp, and 15 MVp. These models are crucial for the following aspects: 1. **Field Flatness Correction**: Improving image quality. 2. **Beam Hardening Correction**: Reducing image artifacts caused by beam hardening effects. 3. **Detector Response Correction**: Enhancing the accuracy of detector output data. 4. **Radiation Protection and Shielding Assessment**: Ensuring the safety of personnel and the environment around the equipment. Through these models, researchers can more accurately simulate high-energy X-ray sources and apply these source definitions in various simulation spaces, thereby improving the accuracy and reliability of 2D and 3D radiographic imaging and shielding assessments.