Strong reduction of field-dependent microwave surface resistance in YBa$_{2}$Cu$_{3}$O$_{7-δ}$ with sub-micrometric BaZrO$_3$ inclusions

N. Pompeo,R. Rogai,E. Silva,A. Augieri,V. Galluzzi,G. Celentano
DOI: https://doi.org/10.1063/1.2803856
2007-10-10
Abstract:We observe a strong reduction of the field induced thin film surface resistance measured at high microwave frequency ($\nu=$47.7 GHz) in YBa$_{2}$Cu$_{3}$O$_{7-\delta}$ thin films grown on SrTiO$_3$ substrates, as a consequence of the introduction of sub-micrometric BaZrO$_3$ particles. The field increase of the surface resistance is smaller by a factor of $\sim$3 in the film with BaZrO$_3$ inclusions, while the zero-field properties are not much affected. Combining surface resistance and surface reactance data we conclude (a) that BaZrO$_3$ inclusions determine very deep and steep pinning wells and (b) that the pinning changes nature with respect to the pure film.
Superconductivity,Materials Science
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