Frequency Scales for Current Statistics of Mesoscopic Conductors

K. E. Nagaev,S. Pilgram,M. Buttiker

DOI: https://doi.org/10.1103/PhysRevLett.92.176804

2003-06-18

Abstract:We calculate the third cumulant of current in a chaotic cavity with contacts of arbitrary transparency as a function of frequency. Its frequency dependence drastically differs from that of the conventional noise. In addition to a dispersion at the inverse RC time characteristic of charge relaxation, it has a low-frequency dispersion at the inverse dwell time of electrons in the cavity. This effect is suppressed if both contacts have either large or small transparencies.

Mesoscale and Nanoscale Physics

What problem does this paper attempt to address?

The problem that this paper attempts to solve is: **In mesoscopic conductors, the behavior of the third cumulant of current statistics at different frequencies and its physical significance**. Specifically, the author focuses on:

1. **The dispersion characteristics of the third cumulant of current statistics at low frequencies**:
- Compared with traditional noise (such as the second cumulant), the third cumulant shows significantly different characteristics at low frequencies.
- This low - frequency dispersion is caused by the internal charge - neutrality fluctuations in the system. These fluctuations do not directly contribute to the measurable current, but they will affect the noise intensity and thus have an impact on high - order cumulants.

2. **The influence of different contact transparencies on current statistics**:
- Research shows that when the transparencies of both contact points are large or small, this low - frequency dispersion effect will be suppressed.
- For tunneling contacts and ballistic contacts, due to their special properties, this low - frequency dispersion will not occur either.

3. **The relationship between the frequency scale and the time constant**:
- The paper explores the influence of the charge relaxation time and the electron residence time in the cavity on current statistics.
- By introducing the RC time (describing charge relaxation) and the residence time (describing the stay of electrons in the cavity), the author analyzes how these time constants affect the frequency - dependence of the current.

### Formula Summary

- **Charge relaxation resistance \( R_Q \)**:
\[
R_Q=(G_L + G_R)^{-1}
\]

- **Residence time \( \tau_D \)**:
\[
\tau_D=\frac{e^2 R_Q N_F}{h}
\]
where \( N_F \) is the density of states in the cavity.

- **Electrochemical capacitance \( C_\mu \)**:
\[
C_\mu^{-1}=C^{-1}+(e^2 N_F)^{-1}
\]

- **The expression of the third cumulant \( P_3 \) in the low - frequency limit**:
\[
P_3(\omega_1,\omega_2)=e^2 I\{\text{complex term}\}
\]
where the specific form is rather complex and involves the conductivities \( G_L, G_R \) and transparencies \( \Gamma_L,\Gamma_R \) of the contact points, as well as the frequencies \( \omega_1,\omega_2 \).

### Physical Significance

The main contribution of the paper lies in revealing the unique behavior of the third cumulant of current statistics at low frequencies in mesoscopic systems. This behavior originates from the internal dynamics of the system, especially the influence of charge - neutrality fluctuations. This is of great significance for understanding the transport phenomena in mesoscopic conductors and provides a theoretical basis for experimental verification.