Abstract:The charge fluctuations of two nearby mesoscopic conductors coupled only via the long range Coulomb force are discussed and used to find the dephasing rate which one conductor exerts on the other. The discussion is based on a formulation of the scattering approach for charge densities and the density response to a fluctuating potential. Coupling to the Poisson equation results in an electrically self-consistent description of charge fluctuations. At equilibrium the low-frequency noise power can be expressed with the help of a charge relaxation resistance (which together with the capacitance determines the RC-time of the structure). In the presence of transport the low frequency charge noise power is determined by a resistance which reflects the presence of shot noise. We use these results to derive expressions for the dephasing rates of Coulomb coupled conductors and to find a self-consistent expression for the measurement time.

What problem does this paper attempt to address?

The problem that this paper attempts to solve is to understand the charge fluctuations between two mesoscopic conductors coupled by long - range Coulomb forces and their influence on the dephasing rate. Specifically, the author explores the following aspects: 1. **Charge Fluctuations and Dephasing Rate**: Study the charge fluctuations between two adjacent mesoscopic optical conductors due to Coulomb coupling, and use these fluctuations to determine the dephasing rate exerted by one conductor on the other. 2. **Description of Charge Fluctuations**: Based on the scattering theory and the method of density response function, combined with the Poisson equation, a self - consistent description of charge fluctuations is given. In the equilibrium state, the low - frequency noise power can be characterized by the charge relaxation resistance ($R_q$) and capacitance, which determines the RC time constant of the structure. 3. **Charge Noise in the Transmission State**: In the case of a transmission current, the low - frequency charge noise power is determined by the resistance $R_v$ reflecting the shot noise characteristics. 4. **Expression of Dephasing Rate**: Use the above results to derive the expression of the dephasing rate between Coulomb - coupled conductors and find a self - consistent expression of the measurement time. 5. **Charge Relaxation Resistance and Shot Noise Resistance**: Discuss the behaviors of the charge relaxation resistance $R_q$ and the Shot Noise resistance $R_v$ under different conditions, especially their applications in quantum point contacts (QPC). ### Formula Summary - **Charge Relaxation Resistance**: \[ 2kT R_q^{(j)}=\frac{e^{2}S_{N_jN_j}(0)}{(e^{2}D_j)^{2}} \] - **Shot Noise Resistance**: \[ 2e|V| R_v^{(j)}=\frac{e^{2}S_{N_jN_j}(0)}{(e^{2}D_j)^{2}} \] - **Dephasing Rate**: \[ \Gamma_{\phi}^{(ij)}=\frac{e^{4}}{2\hbar^{2}}G_{ij}^{2}S_{N_jN_j}(0) \] ### Main Contributions The main contribution of the paper lies in providing a self - consistent theoretical framework for describing charge fluctuations in Coulomb - coupled conductors and their influence on the phase relaxation rate. This not only helps to understand the charge dynamics of mesoscopic systems but also provides theoretical support for experiments, especially giving a reasonable explanation for the phenomena observed in Aharonov - Bohm interference experiments. Through this theoretical framework, the author can explain the bimodal behavior of the dephasing rate observed in experiments and provide a self - consistent expression of the measurement time, which is of great significance for further research on quantum effects in mesoscopic systems.

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