Modeling the Electrical Degradation of Micro-transfer-Printed 845 nm VCSILs for Silicon Photonics

Michele Zenari,Matteo Buffolo,Carlo De Santi,Jeroen Goyvaerts,Alexander Grabowski,Johan Gustavsson,Roel Baets,Anders Larsson,Günther Roelkens,Gaudenzio Meneghesso,Enrico Zanoni,Matteo Meneghini
DOI: https://doi.org/10.1109/ted.2023.3346370
IF: 3.1
2024-02-02
IEEE Transactions on Electron Devices
Abstract:This article deals for the first time with the electrical degradation of novel 845 nm vertical-cavity silicon-integrated lasers (VCSILs) for silicon photonics (SiPh). We analyzed the reliability of these devices by submitting them to high current stress. The experimental results showed that stress induced: 1) a significant increase in the series resistance, occurring in two separated time-windows and 2) a lowering of the turn-on voltage. To understand the origin of such degradation phenomena, we simulated the - characteristics and the band diagrams by a Poisson-drift-diffusion simulator. We demonstrated that the degradation was caused by the diffusion of mobile species capable of compensating the p-type doping. The diffusing species are expected to migrate from the p-contact region in the top distributed Bragg reflector (DBR) towards the active layers.
engineering, electrical & electronic,physics, applied
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