Strength and microstructure of silicon nitride/aluminum interface fabricated by squeeze cast brazing

Katsuaki Suganuma

DOI: https://doi.org/10.1016/0955-2219(93)90057-x

IF: 5.7

1993-01-01

Journal of the European Ceramic Society

Abstract:The oxidized silicon nitride was brazed with pure aluminum by the squeeze cast method. The bending strength of the joint was above 400 MPa. The interfacial microstructure has been identified by high-resolution TEM and analytical TEM methods. Two distinct reaction layers were formed at the interface and the thickness of both layers were almost the same, about 30–40 nm. The one adjacent to silicon nitride had a nanocrystalline structure without a boundary phase. The nanocrystals were identified as β′-sialon containing silicon, aluminum, oxygen and nitrogen. Every crystal inclined slightly to the matrix grain. The other layer was the amorphous aluminum-silicon-oxygen layer. This layer had the dense structure and sometimes contained small particles composed of yttrium, calcium and iron, which were the reaction product of the boundary phase of silicon nitride and the braze.

materials science, ceramics