Enhanced Band-Tuning and Quality of Ni-Doped Ga2O3 Films via Low-Power RF Magnetron Sputtering

Chia-Hsun Hsu,Yu-Quan Zhu,Ruo-Yan Huang,Pao-Hsun Huang,Chen Wang,Yun-Shao Cho,Shui-Yang Lien
DOI: https://doi.org/10.1039/d4tc02882a
IF: 6.4
2024-10-02
Journal of Materials Chemistry C
Abstract:Low power density during radio-frequency (RF) magnetron of Ni-doped gallium oxide (Ga2O3) films offers notable advantages in terms of improved film quality and realizable band-tuning. In this research, the Ni-doped Ga2O3 films are deposited using RF magnetron sputtering at different powers of 70-140 W. The effects of low sputtering power on the optical and chemical properties of Ni-doped Ga2O3 films are studied. The experimental results illustrate that an effective Ni doping is observed at higher than 100 W as the obvious increase in the intensity of the Ni radical and the Ni atomic ratio. Then, the Ni-doped Ga2O3 film prepared at 120 W reveals a larger cluster size and a maximum ratio of the Ni3+ and non-lattice oxygen, resulting in the highest values in mobility and carrier concentration of 3.5 cm2V-1s-1 and 5.0×1016 cm-3, respectively. With increasing powers, a decrease in band gap from 5.2 to 4.8 eV is obtained. The RF sputtering of Ni-doped Ga2O3 films at a lower power density, ranging from 0.18 to 0.36 W/cm2, provide an alternative for industrialization over a large-area.
materials science, multidisciplinary,physics, applied
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