On material removal analysis in ECSM process during micro-channelling with rough tool: Experimental investigation and numerical simulation

Tarlochan Singh,Sahil Sharma,Gaurav Parmar,Akshay Dvivedi
DOI: https://doi.org/10.1016/j.measurement.2024.114440
IF: 5.6
2024-04-01
Measurement
Abstract:The prevailing ECSM investigation using rough tools exhibits its superior performance, especially during micro-channelling. However, the critical aspects related to microchannel quality, such as straightness error, depth/width ratio, MRR and surface quality, have not been thoroughly explored in the existing literature. This research endeavours to fill this gap by addressing these pertinent issues. It also introduces a finite element-based model to analyze the transient temperature distribution and material removal rate, considering the influence of multiple spark discharges generated by rough tools during micro-channelling. The research encompasses theoretical analysis, simulations accounting for partition energy, and experimental assessment of various ECSM parameters for fabricating microchannels with better MRR, depth/width ratio and straightness without compromising the machined surface quality. Theoretical and simulation analyses emphasize the superior performance of rough tools in achieving efficient micro-channel fabrication compared to smooth tools, attributed to a substantial 245 % higher electric field distribution over the entire rough tool surface. Particularly, under low-energy interactions (70 V, 20 % electrolyte concentration, 6 mm/min tool feed, and 3 ms pulse on time), the close alignment between experimental, simulation and regression model results validates the accuracy of the FEM model in capturing the performance of the rough tool in ECSM micro-channelling. This comprehensive investigation provides valuable insights into the benefits of employing rough tools and the factors influencing the quality and efficiency of ECSM for microchannel fabrication.
engineering, multidisciplinary,instruments & instrumentation
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