Physical prior-guided deep learning for SIM reconstruction: modeling object-to-image degradation

Zitong Jin,Junkang Dai,Bowen Liu,Zhixiang Wei,Zhenan Fu,Huaian Chen,Yi Jin
DOI: https://doi.org/10.1364/oe.537692
IF: 3.8
2024-10-02
Optics Express
Abstract:Zitong Jin, Junkang Dai, Bowen Liu, Zhixiang Wei, Zhenan Fu, Huaian Chen, Yi Jin Structured illumination microscopy (SIM) provides an enhanced spatial resolution of up to twice the conventional capacity. Recently, many ... [Opt. Express 32, 37108-37126 (2024)]
optics
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