Accelerated Phase Shifting for Structured Illumination Microscopy Based on Deep Learning
Xu Chen,Bowen Li,Shaowei Jiang,Terrance Zhang,Xu Zhang,Peiwu Qin,Xi Yuan,Yongbing Zhang,Guoan Zheng,Xiangyang Ji
DOI: https://doi.org/10.1109/tci.2021.3093788
IF: 5.4
2021-01-01
IEEE Transactions on Computational Imaging
Abstract:Structured illumination microscopy (SIM) enhances spatial resolution by projecting sinusoidal patterns with various orientations and lateral phase shifts. Here, we report a framework, termed DNN-SIM, powered by a deep neural network that learns the physical relationship between images with different lateral phase shifts. This approach captures one image per sinusoidal pattern orientation and infers the remaining phase-shifted images by the network, reducing the acquisition time to one-third of conventional 2D-SIM. We further extend the DNN-SIM to 3D applications and reduce the acquisition time to one-fifth of the conventional method without sacrificing the resolution. The reported DNN-SIM framework is not sample-specific, and can be used to handle new samples with features that the network has not previously encountered or learned. DNN-SIM is compatible with most existing SIM setups and reconstruction algorithms. It has the potential to address challenges associated with phototoxicity and photobleaching in super-resolution fluorescence microscopy.
engineering, electrical & electronic,imaging science & photographic technology