Deep learning enables structured illumination microscopy with low light levels and enhanced speed

Luhong Jin,Bei Liu,Fenqiang Zhao,Stephen Hahn,Bowei Dong,Ruiyan Song,Timothy C. Elston,Yingke Xu,Klaus M. Hahn
DOI: https://doi.org/10.1038/s41467-020-15784-x
IF: 16.6
2020-01-01
Nature Communications
Abstract:Structured illumination microscopy (SIM) surpasses the optical diffraction limit and offers a two-fold enhancement in resolution over diffraction limited microscopy. However, it requires both intense illumination and multiple acquisitions to produce a single high-resolution image. Using deep learning to augment SIM, we obtain a five-fold reduction in the number of raw images required for super-resolution SIM, and generate images under extreme low light conditions (at least 100× fewer photons). We validate the performance of deep neural networks on different cellular structures and achieve multi-color, live-cell super-resolution imaging with greatly reduced photobleaching.
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