Three-dimensional structured illumination microscopy with enhanced axial resolution
Xuesong Li,Yicong Wu,Yijun Su,Ivan Rey-Suarez,Claudia Matthaeus,Taylor B Updegrove,Zhuang Wei,Lixia Zhang,Hideki Sasaki,Yue Li,Min Guo,John P Giannini,Harshad D Vishwasrao,Jiji Chen,Shih-Jong J Lee,Lin Shao,Huafeng Liu,Kumaran S Ramamurthi,Justin W Taraska,Arpita Upadhyaya,Patrick La Riviere,Hari Shroff
DOI: https://doi.org/10.1038/s41587-022-01651-1
Abstract:The axial resolution of three-dimensional structured illumination microscopy (3D SIM) is limited to ∼300 nm. Here we present two distinct, complementary methods to improve axial resolution in 3D SIM with minimal or no modification to the optical system. We show that placing a mirror directly opposite the sample enables four-beam interference with higher spatial frequency content than 3D SIM illumination, offering near-isotropic imaging with ∼120-nm lateral and 160-nm axial resolution. We also developed a deep learning method achieving ∼120-nm isotropic resolution. This method can be combined with denoising to facilitate volumetric imaging spanning dozens of timepoints. We demonstrate the potential of these advances by imaging a variety of cellular samples, delineating the nanoscale distribution of vimentin and microtubule filaments, observing the relative positions of caveolar coat proteins and lysosomal markers and visualizing cytoskeletal dynamics within T cells in the early stages of immune synapse formation.