Fluorescence Interference Structured Illumination Microscopy for 3D Morphology Imaging with High Axial Resolution
Yile Sun,Hongfei Zhu,Lu Yin,Hanmeng Wu,Mingxuan Cai,Weiyun Sun,Yueshu Xu,Xinxun Yang,Jiaxiao Han,Wenjie Liu,Yubing Han,Xiang Hao,Renjie Zhou,Cuifang Kuang,Xu Liu
DOI: https://doi.org/10.1117/1.ap.5.5.056007
IF: 13.582
2023-01-01
Advanced Photonics
Abstract:Imaging three-dimensional, subcellular structures with high axial resolution has always been the core purpose of fluorescence microscopy. However, trade-offs exist between axial resolution and other important technical indicators, such as temporal resolution, optical power density, and imaging process complexity. We report a new imaging modality, fluorescence interference structured illumination microscopy（FI-SIM）, which is based on three-dimensional structured illumination microscopy for wide-field lateral imaging and fluorescence interference for axial reconstruction. FI-SIM can acquire images quickly within the order of hundreds of milliseconds and exhibit even 30 nm axial resolution in half the wavelength depth range without z-axis scanning. Moreover, the relatively low laser power density relaxes the requirements for dyes and enables a wide range of applications for observing fixed and live subcellular structures.