General Introduction to Transmission Electron Microscopy (TEM)

P. Goodhew

DOI: https://doi.org/10.1002/9781119978848.CH1

2011-07-26

Abstract:Transmission electron microscopy is used to reveal sub-micrometre, internal fine structure in solids. Materials scientists tend to call this microstructure while bioscientists usually prefer the term ultrastructure. The amount and scale of the information which can be extracted by TEM depends critically on four parameters; the resolving power of the microscope (usually smaller than 0.3nm); the energy spread of the electron beam (often several eV); the thickness of the specimen (almost always significantly less than 1 μm), and; the composition and stability of the specimen. The first and second of these depend largely on the depth of your pocket ‐ the more you spend, the better the microscope parameters. The third is usually determined by your experimental skill while the last depends on luck or your choice of experimental system. The slim book by Goodhew et al. (Goodhew, Humphreys and Beanland,

Materials Science