Atomic vs. sub-atomic layer deposition: impact of growth rate on the optical and structural properties of MoS 2 and WS 2

Christian Tessarek,Tim Grieb,Florian F. Krause,Christian Petersen,Alexander Karg,Alexander Hinz,Niels Osterloh,Christian Habben,Stephan Figge,Jon-Olaf Krisponeit,Thomas Schmidt,Jens Falta,A Rosenauer,Martin Eickhoff
DOI: https://doi.org/10.1088/2053-1583/ad3134
IF: 6.861
2024-03-09
2D Materials
Abstract:MoS 2 and WS 2 mono- and multilayers were grown on SiO 2 /Si substrates. Growth by atomic layer deposition at fast growth rates is compared to sub-atomic layer deposition, which is a slow growth rate process with only partial precursor surface coverage per cycle. A Raman spectroscopic analysis of the intensity and frequency difference of the modes reveals different stages of growth from partial to full surface layer coverage followed by layer-by-layer formation. The initial layer thickness and structural quality strongly depends on the growth rate and monolayers only form using sub-atomic layer deposition. Optical activity is demonstrated by photoluminescence characterisation which shows typical excitonic emission from MoS 2 and WS 2 monolayers. A chemical analysis confirming the stoichiometry of MoS 2 is performed by X-ray photoelectron spectroscopy. The surface morphology of layers grown with different growth rates is studied by atomic force microscopy. Plan-view transmission electron microscopy analysis of MoS 2 directly grown on freestanding graphene reveals the local crystalline quality of the layers, in agreement with Raman and photoluminescence results.
materials science, multidisciplinary
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