Reliability Investigation of Silicide-Based Thermoelectric Modules

Mahdi Mejri,Krunoslav Romanjek,Hilaire Ihou Mouko,Yohann Thimont,Mostafa Oulfarsi,Nicolas David,Benoît Malard,Claude Estournès,Anne Dauscher
DOI: https://doi.org/10.1021/acsami.3c15429
IF: 9.5
2024-02-06
ACS Applied Materials & Interfaces
Abstract:The reliability and failure mechanisms of silicide-based thermoelectric modules (n-type Mg(2)(Si,Sn)/p-type HMS) were investigated thanks to two types of thermal tests with either a fixed or a cycling thermal gradient, under different atmospheres. The hot interfaces of the thermoelectric modules were analyzed by scanning electron microscopy and X-ray diffraction after the reliability tests. The current thermoelectric modules do not exhibit any failure mechanism under ambient air for a hot side...
materials science, multidisciplinary,nanoscience & nanotechnology
What problem does this paper attempt to address?