Offcut Substrate-Induced Defect Trapping at Step Edges

Nicolas Bonmassar,Georg Christiani,Gennady Logvenov,Y Eren Suyolcu,Peter A van Aken
DOI: https://doi.org/10.1021/acs.nanolett.4c00832
IF: 10.8
2024-04-27
Nano Letters
Abstract:We report step edge-induced localized defects suppressing subsequent antiphase boundary formation in the bulk structure of a trilayer oxide heterostructure. The heterostructure encompasses a layer of La(0.66)Sr(0.34)MnO(3) sandwiched between a superconducting La(1.84)Sr(0.16)CuO(4) bottom layer and an insulating La(2)CuO(4) top layer. The combination of a minor a-axis mismatch (0.11 Å) and a pronounced c-axis mismatch (2.73 Å) at the step edges leads to the emergence of localized defects...
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
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