Interfacial engineering eliminates energy loss at perovskite/HTL junction

Yingke Ren,Hongyang Fu,Yun Li,Zhaoqian Li,Cong Li,Xingtao An
DOI: https://doi.org/10.1039/d3cc05572h
IF: 4.9
2024-01-01
Chemical Communications
Abstract:Realizing efficient FAPbI 3 -based devices with high open-circuit voltage ( V OC ) is still challenging, due to severe energy loss between the n-type perovskite and p-type hole-transporting layer (HTL).
chemistry, multidisciplinary
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