Abstract:The Fabry-Perot interferometer consists of two parallel reflectors separated by a fixed distance. A monochromatic optical wave incident upon an etalon at an arbitrary angle to the normal of the mirror (semi transparent reflector) will experience multiple reflections within the mirrors. The intensity distribution of the reflected and refracted interfering beams using an etalon generates a set of fringes for each case. The distance of interfering peak or bottom of the fringe is dependent on the spacing between the etalon mirrors and the inverse wavelength of the light. Hence, the basic function of the F-P interferometer is to transform wavelength into an displacement. The main advantages of F-P interferometers based on optical fiber over the other sensor configurations such as Michelson, Mach-Zehnder, and Sagnac interferometers are lightness and compactness, high reliability, low cost, and ease in fabrication. Hence optical fiber based Fabry-Perot (F-P) sensors have been used for measuring temperature, strain, vibration, acoustic waves, and magnetic fields. The measurement of voltage and pressure were done by using an etalon based F-P configuration [2.1]. Beside this classic etalon based configuration, there are several ways to fabricate the Fabry-Perot cavity such as using Bragg gratings in or on the fiber [2.2], and air-glass interfaces at the fiber ends as the reflectors [2.3]. An etalon sensor was fabricated in a continuous length of fiber by a pair of semireflective splices [2.4]. In this case, the optical wave resides inside the fiber so that the sensing mechanism is intrinsic. The F-P sensors based on air-glass reflectors are referred to as the extrinsic F-P interferometers (EFPI). The extrinsic Fabry-Perot interferometer does not have the polarization rotation problem which is inherent in intrinsic F-P interferometer since the light leaves air-glass interface and reflected back through the air gap between the reflectors. Hence the EFPI configuration is suitable for measuring a low exturbance.

Resolution limits of extrinsic Fabry-Perot interferometric displacement sensors utilizing wavelength scanning interrogation

Superresolution Confocal Technology For Displacement Measurements Based On Total Internal Reflection

Enhancing the Resolution Limits of Spectral Interferometric Measurements with Swept-Wavelength Interrogation by Means of a Reference Interferometer

A High-Resolution Displacement Sensor Based on a Grating Interferometer with the Phase Modulation Technique

Fiber-optic extrinsic Fabry-Perot interferometer strain sensor with <50 pm displacement resolution using three-wavelength digital phase demodulation.

Modeling of Low-Finesse, Extrinsic Fiber Optic Fabry-Perot White Light Interferometers

Ultrahigh-Resolution Fiber-Optic Sensing Using a High-Finesse, Meter-Long Fiber Fabry-Perot Resonator

High-Sensitivity EFPI-Based Acoustic Sensor Using in-Fiber Collimator and Adjustable 45° Mirror

Modeling and Signal Processing of Low-Finesse Fabry-Perot Interferometric Fiber Optic Sensors

Ultra-high Sensitivity Optical Sensors Based on Cascaded Two Fabry-Perot Interferometers

Extensible multi-wavelength interrogation method for arbitrary cavities in low-fineness multi-cavity Fabry-Pérot interferometric sensors

High-resolution and large dynamic range fiber extrinsic Fabry–Perot sensing by multi-extrema-tracing technique

Self-compensation three-wavelength demodulation method for the large phase extraction of extrinsic Fabry–Pérot interferometric sensors

Large-scale range diffraction grating displacement sensor based on polarization phase-shifting

An ultracompact high-resolution displacement sensor based on self-interference effect of single optical nanograting

Fast interrogation of dynamic low‐finesse Fabry‐Perot interferometers: A review

Resolution and sensitivity of a Fabry-Perot interferometer with a photon-number-resolving detector

Polymer-capped fiber Fabry-Perot interferometer for large range displacement sensing

A Fiber-Based Chromatic Dispersion Probe for Simultaneous Measurement of Dual-Axis Absolute and Relative Displacement

A Fiber-Based Chromatic Dispersion Probe for Simultaneous Measurement of X-Axis and Z-Axis Displacements with Nanometric Resolutions

Chapter 2 – Extrinsic Fabry-perot Interferometer Measuring Magnetic Field a Typical Efpi Sensor Configuration Is Shown in Figure 2.1. the Light from a Laser Source