Abstract:The crystal structure and optical properties of the van der Waals layered CuInP2Se6 are systematically studied. A dual‐function detector based on 2D CuInP2Se6, exhibiting an ultralow and stable dark current, is fabricated. This detector demonstrates remarkable sensitivity in detecting UV‐vis light and X‐rays, and it is successfully employed in high‐resolution image sensing applications. Metal thio(seleno)phosphates are renowned for their multifaceted physical characteristics and versatile applications, particularly in optoelectronics. In detection applications, a low and stable dark current is crucial, enhancing the sensitivity and signal‐to‐noise ratio of detectors. Herein, a van der Waals layered material has synthesized, CuInP2Se6. Despite its nanometric scale, 2D CuInP2Se6 detector transcends the conventional absorption inefficiencies tied to ultrathin materials. It delivers exceptional ultraviolet–visible detection, characterized by an ultralow, stable dark current of 150 fA, and a noise power density of 27.7 fA Hz−1/2 at room temperature. The in‐depth investigation reveals a responsivity of 4.47 A W−1, an external quantum efficiency of 1369%, a special detectivity of 1.44 × 1013 Jones, and a rapid response speed of 280 μs, positioning it at the pinnacle of 2D photodetector performance. The CuInP2Se6's ultralow, stable dark current paves the way for X‐ray detection, achieving an unprecedented sensitivity of 1.32 × 105 μC Gyair−1 cm−2 and a low detection limit of 0.15 μGyair s−1. Furthermore, 2D CuInP2Se6 detector exhibits a remarkable image‐sensing capability, adeptly capturing intricate patterns with high resolution. This discovery indicates its promise in revolutionizing integrated micro/nano optoelectronic devices, opening avenues for advancements in light and X‐ray detection and imaging technologies.

2D CuInP2Se6 in High‐Sensitivity UV‐vis And X‐Ray Detection

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