Origins and consequences of asymmetric nano-FTIR interferograms

G. Németh,H. A. Bechtel,Ferenc Borondics

DOI: https://doi.org/10.1364/oe.520793

IF: 3.8

2024-04-11

Optics Express

Abstract:G. Németh, H. A. Bechtel, Ferenc Borondics Infrared scattering-type near-field optical microscopy, IR s-SNOM, and its broadband variant, nano-FTIR, are pioneering, flagship ... [Opt. Express 32, 15280-15294 (2024)]

optics

What problem does this paper attempt to address?

Rapid Infrared Spectroscopic Nanoimaging with nano-FTIR Holography

Martin Schnell,Monika Goikoetxea,Iban Amenabar,P. Scott Carney,Rainer Hillenbrand

DOI: https://doi.org/10.1021/acsphotonics.0c01164

IF: 7

2020-09-21

ACS Photonics

Abstract:Scattering-type scanning near-field optical microscopy (s-SNOM) and its derivate, Fourier transform infrared nanospectroscopy (nano-FTIR), are emerging techniques for infrared (IR) nanoimaging and spectroscopy, with applications in diverse fields ranging from nanophotonics, chemical imaging, and materials science. However, spectroscopic nanoimaging is still challenged by the limited acquisition rate of current nano-FTIR technology. Here we combine s-SNOM, nano-FTIR, and synthetic optical holography (SOH) to achieve infrared spectroscopic nanoimaging at unprecedented speed (eight spectroscopically resolved images in 20 min), which we demonstrate with a polymer composite sample. Beyond being fast, our method promises to enable nanoimaging in the far IR spectral range, which is covered by IR supercontinuum and synchrotron sources, but not by current quantum cascade laser technology.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsphotonics.0c01164?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsphotonics.0c01164</a>.S1. Interferogram bandpass sampling is robust to small global shifts in the reference mirror position d. S2. Acquisition time and oversampling considerations for nano-FTIR holography. S3. Simulation of nano-FTIR holography (<a class="ext-link" href="/doi/suppl/10.1021/acsphotonics.0c01164/suppl_file/ph0c01164_si_001.pdf">PDF</a>)S4. Matlab script for the reconstruction of nano-FTIR holograms (<a class="ext-link" href="/doi/suppl/10.1021/acsphotonics.0c01164/suppl_file/ph0c01164_si_002.zip">ZIP</a>)This article has not yet been cited by other publications.

physics, condensed matter,optics, applied,materials science, multidisciplinary,nanoscience & nanotechnology
Detection and Signal Processing for Near-Field Nanoscale Fourier Transform Infrared Spectroscopy

Jonathan M. Larson,Hans A. Bechtel,Robert Kostecki

2023-03-18

Abstract:Researchers from a broad spectrum of scientific and engineering disciplines are increasingly using near-field infrared spectroscopic techniques to characterize materials nondestructively and with nanoscale spatial resolution. However, sub-optimal understanding of a technique's implementation can complicate data interpretation and even act as a barrier to enter the field. Here we outline the key detection and processing steps involved in producing scattering-type near-field nanoscale Fourier transform infrared spectra (nano-FTIR). The largely self-contained work (i) explains how normalized complex-valued nano-FTIR spectra are generated, (ii) rationalizes how the real and imaginary components of spectra relate to dispersion and absorption respectively, (iii) derives a new and generally valid equation for spectra which can be used as a springboard for additional modeling of the scattering processes, and (iv) provides an algebraic expression that can be used to extract the sample's local extinction coefficient from nano-FTIR. The algebraic expression is validated with nano-FTIR and attenuated total reflectance Fourier transform infrared (ATR-FTIR) spectra on samples of polystyrene and Kapton.

Optics,Materials Science,Applied Physics
Detection and Signal Processing for Near‐Field Nanoscale Fourier Transform Infrared Spectroscopy

Jonathan M. Larson,Hans A. Bechtel,Robert Kostecki

DOI: https://doi.org/10.1002/adfm.202406643

IF: 19

2024-10-03

Advanced Functional Materials

Abstract:Infrared near‐field nano‐FTIR is increasingly seen as an attractive methodology to characterize the physicochemical properties of materials at the nanoscale. However, complexities associated with technique implementation present challenges to data intuition, and interpretation, and can act as a barrier to entering the field. This work presents a detailed exposition and rigorous mathematical treatment of the technique to alleviate these challenges. Researchers from a broad spectrum of scientific and engineering disciplines are increasingly using scattering‐type near‐field infrared spectroscopic techniques to characterize materials non‐destructively with nanoscale spatial resolution. However, a sub‐optimal understanding of a technique's implementation can complicate data interpretation and act as a barrier to entering the field. Here the key detection and processing steps involved in producing scattering‐type near‐field nanoscale Fourier transform infrared spectra (nano‐FTIR) are outlined. The self‐contained mathematical and experimental work derives and explains: i) how normalized complex‐valued nano‐FTIR spectra are generated, ii) why the real and imaginary components of spectra qualitatively relate to dispersion and absorption respectively, iii) a new and generally valid equation for spectra which can be used as a springboard for additional modeling of the scattering processes, and iv) an algebraic expression that can be used to extract an approximation to the sample's local extinction coefficient from nano‐FTIR. The algebraic model for weak oscillators is validated with nano‐FTIR and attenuated total reflectance Fourier transform infrared (ATR‐FTIR) spectra on samples of polystyrene and Kapton and further provides a pedagogical pathway to cementing some of the technique's key qualitative attributes.

materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
Nanoscale-resolved chemical identification of thin organic films using infrared near-field spectroscopy and standard Fourier transform infrared references

Stefan Mastel,Alexander A. Govyadinov,Thales V. A. G. de Oliveira,Iban Amenabar,Rainer Hillenbrand

DOI: https://doi.org/10.1063/1.4905507

IF: 4

2015-01-12

Applied Physics Letters

Abstract:We establish a solid basis for the interpretation of infrared near-field spectra of thin organic films on highly reflective substrates and provide guidelines for their straightforward comparison to standard far-field Fourier transform infrared (FTIR) spectra. Particularly, we study the spectral behavior of near-field absorption and near-field phase, both quantities signifying the presence of a molecular resonance. We demonstrate that the near-field phase spectra only weakly depend on the film thickness and can be used for an approximate comparison with grazing incidence FTIR (GI-FTIR) spectra. In contrast, the near-field absorption spectra can be compared more precisely with far-field spectra: for ultrathin films they match well GI-FTIR spectra, while for thick films a good agreement with standard transmission FTIR spectra is found. Our results are based on experimental data obtained by nanoscale FTIR (nano-FTIR) spectroscopy and supported by a comprehensive theoretical analysis.

physics, applied
Understanding the resolution and sensitivity in photothermal nanoscale chemical imaging - a point spread function approach

Georg Ramer,Yide Zhang,Bernhard Lendl,Ufuk Yilmaz,Liam O’Faolain,Gustavo Vinicius Bassi Lukasievicz

DOI: https://doi.org/10.26434/chemrxiv-2024-qlgdz-v3

2024-01-24

Abstract:Atomic force microscopy-infrared spectroscopy (AFM-IR) is a photothermal scanning probe technique that combines nanoscale spatial resolution with the chemical analysis capability of mid-infrared spectroscopy. Using this hybrid technique, chemical identification down to the single molecule level has been demonstrated. However, the mechanism at the heart of AFM-IR, the transduction of local photothermal heating to cantilever deflection, is still not fully understood. Existing physical models only describe this process in few special cases but not in many of the types of sample geometries encountered in the practical use of AFM-IR. In this work an analytical expression for modeling the temperature and photothermal expansion process is introduced, verified with finite element simulations and validated with AFM-IR experiments. This method describes AFM-IR signal amplitudes in vertically and laterally heterogeneous samples and allows us study the effect of position and size of an absorber, laser repetition rate and pulse width on AFM-IR signal amplitudes and spatial resolution. The analytical can be used to identify optimal AFM-IR experimental settings in conventional and advanced AFM-IR modes (e.g., tapping mode, surface sensitive mode). It also paves the way for signal inversion based super-resolution AFM-IR.

Chemistry
The origin of interferometric effect in scattering near-field scanning optical microscopy (presentation video)

yan li,nan zhou,edward c kinzel,xifeng ren,xianfan xu

DOI: https://doi.org/10.1117/12.2062810

2014-01-01

Abstract:In this work, we investigate the formation of interference patterns appearing in s-NSOM results. A single nanoslit is used to demonstrate the mechanism of formation of these interference patterns experimentaly: the interaction between the in-plane component of the incident light and SPP launched by the nanoslit. This is in contrast to some other explanations that the SPP is launched from the NSOM probe. We also use an analytical model and numerical simulations to compute the formation of interference patters. This study will help to understand s-NSOM results from plasmonic nanostructures.
Fourier transform infrared nano-spectroscopy: Mechanism and applications

Chen Nan,Wang Yue,Liu Tao,Xia Yang

DOI: https://doi.org/10.1080/05704928.2020.1830789

2020-11-10

Applied Spectroscopy Reviews

Abstract:<span>Fourier transform infrared (FTIR) spectroscopy is an important tool for material characterization. However, due to the diffraction limit, conventional infrared spectroscopy cannot be applied to nanoscale material. In the past decade, FTIR nano-spectroscopy (nano-FTIR), combining scanning near-field optical microscopy and FTIR, has made significant progress. It provides scientists a powerful tool to study polymers, 2D-materials, semiconductor devices, and biomaterials at the nanoscale. In this review, we introduce the development and working mechanism of nano-FTIR, and summarize some typical applications in different research fields. The purpose of this review is to allow readers to understand the basic principles of nano-FTIR, its current development status, and the application potential of this technology. Finally, we briefly summarize current challenges faced by this technology and present some research directions that deserve attention in the future.</span>

spectroscopy,instruments & instrumentation
Hyperspectral infrared nanoimaging of organic samples based on Fourier transform infrared nanospectroscopy

Iban Amenabar,Simon Poly,Monika Goikoetxea,Wiwat Nuansing,Peter Lasch,Rainer Hillenbrand

DOI: https://doi.org/10.1038/ncomms14402

IF: 16.6

2017-02-15

Nature Communications

Abstract:Infrared nanospectroscopy enables novel possibilities for chemical and structural analysis of nanocomposites, biomaterials or optoelectronic devices. Here we introduce hyperspectral infrared nanoimaging based on Fourier transform infrared nanospectroscopy with a tunable bandwidth-limited laser continuum. We describe the technical implementations and present hyperspectral infrared near-field images of about 5,000 pixel, each one covering the spectral range from 1,000 to 1,900 cm−1. To verify the technique and to demonstrate its application potential, we imaged a three-component polymer blend and a melanin granule in a human hair cross-section, and demonstrate that multivariate data analysis can be applied for extracting spatially resolved chemical information. Particularly, we demonstrate that distribution and chemical interaction between the polymer components can be mapped with a spatial resolution of about 30 nm. We foresee wide application potential of hyperspectral infrared nanoimaging for valuable chemical materials characterization and quality control in various fields ranging from materials sciences to biomedicine.

multidisciplinary sciences
Subsurface chemical nanoidentification by nano-FTIR spectroscopy

Lars Mester,Alexander A. Govyadinov,Shu Chen,Monika Goikoetxea,Rainer Hillenbrand

DOI: https://doi.org/10.1038/s41467-020-17034-6

IF: 16.6

2020-07-03

Nature Communications

Abstract:Abstract Nano-FTIR spectroscopy based on Fourier transform infrared near-field spectroscopy allows for label-free chemical nanocharacterization of organic and inorganic composite surfaces. The potential capability for subsurface material analysis, however, is largely unexplored terrain. Here, we demonstrate nano-FTIR spectroscopy of subsurface organic layers, revealing that nano-FTIR spectra from thin surface layers differ from that of subsurface layers of the same organic material. Further, we study the correlation of various nano-FTIR peak characteristics and establish a simple and robust method for distinguishing surface from subsurface layers without the need of theoretical modeling or simulations (provided that chemically induced spectral modifications are not present). Our experimental findings are confirmed and explained by a semi-analytical model for calculating nano-FTIR spectra of multilayered organic samples. Our results are critically important for the interpretation of nano-FTIR spectra of multilayer samples, particularly to avoid that geometry-induced spectral peak shifts are explained by chemical effects.

multidisciplinary sciences
Single-molecule spectromicroscopy: the door into sub-diffraction refractometry

T. A. Anikushina,M. G. Gladush,A. A. Gorshelev,A. V. Naumov

DOI: https://doi.org/10.48550/arXiv.1502.00109

2015-02-18

Abstract:We suggest a novel approach for probing of local fluctuations of the refractive index $n$ in solids by means of single-molecule (SM) spectroscopy. It is based on the dependence $T_1(n)$ of the effective radiative lifetime $T_1$ of dye centres in solids on $n$ due to the local field effects. Detection of SM zero-phonon lines at ultra-low temperatures gives the values of SM natural spectral linewidth (which is inverse proportional to $T_1$) and makes it possible to reveal the distribution of the local $n$ values in solids. Here we demonstrate this possibility on the example of amorphous polyethylene and polycrystalline naphthalene doped with terrylene.

Optics
Understanding AFM-IR Signal Dependence on Sample Thickness and Laser Excitation: Experimental and Theoretical Insights

Devon S. Jakob,Jeffrey J. Schwartz,Georges Pavlidis,Karen E. Grutter,Andrea Centrone

DOI: https://doi.org/10.1021/acs.analchem.4c02834

IF: 7.4

2024-10-05

Analytical Chemistry

Abstract:Photothermal induced resonance (PTIR), also known as atomic force microscopy-infrared (AFM-IR), enables nanoscale IR absorption spectroscopy by transducing the local photothermal expansion and contraction of a sample with the tip of an atomic force microscope. PTIR spectra enable material identification at the nanoscale and can measure sample composition at depths >1 μm. However, implementation of quantitative, multivariate, nanoscale IR analysis requires an improved understanding of PTIR signal...

chemistry, analytical
AFM-IR: Technology and Applications in Nanoscale Infrared Spectroscopy and Chemical Imaging

Alexandre Dazzi,Craig B. Prater

DOI: https://doi.org/10.1021/acs.chemrev.6b00448

IF: 62.1

2016-12-13

Chemical Reviews

Abstract:Atomic force microscopy-based infrared spectroscopy (AFM-IR) is a rapidly emerging technique that provides chemical analysis and compositional mapping with spatial resolution far below conventional optical diffraction limits. AFM-IR works by using the tip of an AFM probe to locally detect thermal expansion in a sample resulting from absorption of infrared radiation. AFM-IR thus can provide the spatial resolution of AFM in combination with the chemical analysis and compositional imaging capabilities of infrared spectroscopy. This article briefly reviews the development and underlying technology of AFM-IR, including recent advances, and then surveys a wide range of applications and investigations using AFM-IR. AFM-IR applications that will be discussed include those in polymers, life sciences, photonics, solar cells, semiconductors, pharmaceuticals, and cultural heritage. In the Supporting Information , the authors provide a theoretical section that reviews the physics underlying the AFM-IR measurement and detection mechanisms.

chemistry, multidisciplinary
Analysis of visible and infrared spectroscopic detection in scattering scanning near-field optical microscopy

S. Stanciu,D. Tranca,G. Stanciu,R. Hristu

DOI: https://doi.org/10.1109/ICTON62926.2024.10648194

2024-07-14

Abstract:Spectroscopic imaging through scattering scanning near-field optical microscopy (s-SNOM) has emerged as a powerful technique for detecting and characterizing nanoscale materials across various fields. At any given wavelength, s-SNOM imaging yields a pair of two complementary images known as amplitude and phase. While amplitude image is usually correlated to the reflectivity, phase-imaging in s-SNOM is especially important because it can unveil material-specific absorption peaks, often found within the mid-infrared spectrum. This explains the relatively limited studies of spectral s-SNOM imaging within the visible range. Here, we examine the spectroscopic detection capabilities of s-SNOM from a theoretical standpoint, considering various spectral domains, sample types, and tip materials, and compare these findings with experimental results.

Physics,Materials Science
Modelling photothermal induced resonance microscopy: the role of interface thermal resistances

Francesco Rusconi,Marco Finazzi,John M. Stormonth-Darling,Gordon Mills,Michela Badioli,Leonetta Baldassarre,Michele Ortolani,Paolo Biagioni,Valeria Giliberti

DOI: https://doi.org/10.48550/arXiv.2111.07303

2021-11-14

Abstract:Infrared (IR) nanospectroscopy by photothermal induced resonance (PTIR) is a novel experimental technique that combines the nanoscale resolution granted by atomic force microscopy (AFM) and the chemical labelling made possible by IR absorption spectroscopy. While the technique has developed enormously over the last decade from an experimental point of view, the theoretical modelling of the signal still varies significantly throughout the literature and misses a solid benchmark. Here, we report an analysis focused on the electromagnetic and thermal simulations of a PTIR experiment. Thanks to a control experiment where the signal is acquired as a function of the thickness of a polymer film and for different tip geometries, we find clear evidence that the interface thermal resistances play a key role in the determination of the measured signal and should therefore always be accounted for by any quantitative modelling.

Materials Science
Sub-Tip-Radius Near-Field Interactions in Nano-FTIR Vibrational Spectroscopy on Single Proteins

Jun Nishida,Akihiro Otomo,Takanori Koitaya,Akitoshi Shiotari,Taketoshi Minato,Ryota Iino,Takashi Kumagai

DOI: https://doi.org/10.1021/acs.nanolett.3c03479

IF: 10.8

2024-01-11

Nano Letters

Abstract:Tip-enhanced vibrational spectroscopy has advanced to routinely attain nanoscale spatial resolution, with tip-enhanced Raman spectroscopy even achieving atomic-scale and submolecular sensitivity. Tip-enhanced infrared spectroscopy techniques, such as nano-FTIR and AFM-IR spectroscopy, have also enabled the nanoscale chemical analysis of molecular monolayers, inorganic nanoparticles, and protein complexes. However, fundamental limits of infrared nanospectroscopy in terms of spatial resolution and...

materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
Performance of visible and mid-infrared scattering-type near-field optical microscopes

T Taubner,R Hillenbrand,F Keilmann

DOI: https://doi.org/10.1046/j.1365-2818.2003.01164.x

Abstract:We describe the principles of two scattering-type near-field optical microscopes (s-SNOMs), one operating at 633 nm wavelength, the other at selectable wavelengths in the range 7.3-11.3 micro m, and compare the measurement experience. Both use interferometric detection of scattered radiation, and are therefore capable of amplitude and phase-contrast imaging. In this study both instruments use the same or even identical commercial probe tips, and measure a single, three-component, test sample. Our results show that the imaging process of s-SNOM is wavelength-independent, namely, that the resolution is determined by the properties of the tip only, and that the contrast is given by the complex refractive index of the sample, predictable from a simple, analytical model of tip-sample interaction. A novel, 'edge-darkening' artefact is described which may appear in s-SNOM and that is wavelength-independent.
Near-field Optical Characterization of Low-Dimensional Nanomaterials

Debo Hu,Qing Dai

DOI: https://doi.org/10.1360/n972018-00864

2018-01-01

Chinese Science Bulletin (Chinese Version)

Abstract:Due to the wave nature of light, the spatial resolution of traditional far-field optical microscopy is fundamentally prohibited to be much smaller than the wavelength, thus cannot fulfill the requirement of nano-characterization of low-dimensional materials. This diffraction limit can be circumvented by the optical version of scanning probe microscopy via incorporating the near-field optical information into the imaging process. In the last one and a half decades, scanning near-field optical microscopic techniques, especially scattering-type scanning near-field optical microscopy (s-SNOM), have undergone tremendous development. The wavelength independent spatial resolution of s-SNOM goes far beyond the diffraction limit, leading to an explosive amount of applications that spread throughout the field of materials science. The instrument of s-SNOM is a delicate combination of optical and scanning probe techniques. It utilizes the sharp tip of an atomic force microscope (AFM) probe to achieve nanoscale spatial resolution. Specifically, the light beam from a source is focused onto the apex of the AFM tip by a parabolic mirror. The tip serves as a nanoscale light confiner and enhancer, inducing a strong electromagnetic field (hot spot) underneath the tip apex. When the tip is brought into contact with the investigated sample, this field is modified by its interaction with the sample and carries near-field information of the sample. Then the tip acting as an optical antenna scatters the near-field information into far-field. The back-scattered near-field signals are feed into a photodetector to register a near-field image of the sample. By modulating the near-field signal via tapping the AFM tip and demodulating at the high order harmonics of the tip-tapping frequency, the noise from the background and stray light can be greatly suppressed. Since the near-field hot spot is on the same scale with the tip apex, the spatial resolution of s-SNOM is predominantly defined by the dimensions of the tip; a value of 20 nm is routinely achievable with commercially available and economical AFM tips. In principle, s-SNOM is a permittivity-sensitive technique, thus its most typical application is to imaging the surface permittivity distributions of low-dimensional nanomaterials. In the literatures, s-SNOM has been used to realize material-specific identification of zero-dimensional nanoparticles; nanoscale-resolved mapping of the free-carrier distribution along a one-dimensional nanowire and two-dimensional nanoimaging of the phase boundaries of organic thin films have been reported. Surprisingly, sub-surface imaging of objects with a depth of tens of nanometers has also been proved possible. By using the pump-probe method, the ultrafast dynamical properties of low-dimensional materials can be characterized with simultaneously high spatial and temporal resolutions. The s-SNOM tip can also serve as a momentum matcher between the free-space light and the intrinsic electromagnetic modes supported by low-dimensional materials, therefore, s-SNOM can be used to excite and image these modes. Both field mapping of localized modes in zero-dimensional materials and fringe pattern imaging of propagating modes in one- and two-dimensional materials have been reported. What is more, direct imaging of the wave packets has also been achieved by coupling s-SNOM to ultrafast optics. s-SNOM can provide spectral information of the sample if a broadband light source is used. A Fourier transform infrared (FTIR) spectrometer based on s-SNOM (nano-FTIR) has been developed. The spectra obtained by nano-FTIR have been demonstrated to be in good agreement with those acquired by conventional FTIR. Applications of the nano-FTIR including in-situ monitoring of chemical reactions and quick mapping of the dispersion of polaritons have been reported. In summary, s-SNOM has contributed significantly to the field of low-dimensional material characterizing. Nonetheless, it still has a large potential to expand its scope of applications. This is especially true at extreme conditions like ultrahigh vacuum, ultralow temperature, and strong magnetic field. If s-SNOM operating in these extreme conditions can be developed, it would be of great help in solving the enigma of strongly correlated materials.
Performances for broadband synchrotron photothermal infrared nano-spectroscopy at Diamond Light Source

Mark D. Frogley,Ioannis Lekkas,Chris S. Kelley,Gianfelice Cinque

DOI: https://doi.org/10.1016/j.infrared.2020.103238

2020-03-01

Abstract:<p>Broadband infrared nanospectroscopy with Synchrotron Radiation, via the atomic force microscope detection of photothermal expansion, was first demonstrated at the MIRIAM beamline of Diamond in 2016. Since then, the system has undergone significant developments and has been available to users in collaboration since January 2018. Continuous nano-FTIR spectra are so-far achieved with useful signal-to-noise in the 4000 – 800 wavenumber region and at around 100 nm spatial resolution (depending on sample geometry and thermal diffusion at the modulation frequency of the IR beam), for soft materials like single biological cells and polymers. Here we briefly describe the nanospectroscopy system and evaluate the performances through comparison of measured data for typical samples with theoretical expectations. Noise levels are shown to be cantilever thermal-noise limited at the first contact resonance currently employed, whilst signal levels are consistent with expectations for the focussed IR power density available from the IR beamline and using sinusoidal modulation of the beam tuned to the contact resonance frequency. Finally, planned enhancements of the performance, including access to higher cantilever contact resonances to reduce noise and increase spatial resolution, are discussed.</p>

optics,physics, applied,instruments & instrumentation
Resolving proximal nanometer objects below the diffraction limit with interferometric phase intensity nanoscopy

Guangjie Cui,Do Young Kim,Di Zu,Guanbo Chai,Somin Eunice Lee

2023-10-03

Abstract:The ability to spatially and temporally map nanoscale environments in situ over extended timescales would be transformative for biology, biomedicine, and bioengineering. All nanometer objects, from nanoparticles down to single proteins, scatter light. Interferometric scattering stands as a powerful tool, offering ultrasensitivity and resolution vital for visualizing nanoscale entities. Interferometric scattering from an individual nanoparticle down to an individual protein has been detected; however, resolving adjacent nanometer objects with interferometric scattering has not yet been demonstrated. In this work, we present interferometric phase intensity nanoscopy to resolve adjacent nanometer objects with interferometric scattering. We demonstrate that multiphase and sensitivity of interferometric phase intensity nanoscopy reveals ellipse Airy patterns correlated with nanostructural features. We show that eliminating background fluctuation by employing circular polarized illumination in interferometric phase intensity nanoscopy is essential to separate proximal nanometer objects below the diffraction limit. We envision interferometric phase intensity nanoscopy for resolving a variety of adjacent nanometer objects from nanoparticles down to proximal proteins in situ over extended time periods for wide range of applications in biology, biomedicine and bioengineering.

Optics,Biological Physics
High resolution IR spectroscopy and imaging based on graphene micro emitters

Kenta Nakagawa,Yui Shimura,Yusuke Fukazawa,Ryosuke Nishizaki,Shinichiro Matano,Hideyuki Maki

DOI: https://doi.org/10.48550/arXiv.2108.03327

2021-08-06

Applied Physics

Abstract:IR spectroscopy such as Fourier transform infrared spectroscopy (FTIR) are widely used for the investigation of structure and the quantitative determination of substances in the fields of chemistry, physics, biology, medicine, and astronomy, because the energy of IR absorption corresponds to the energy for each vibrational transition in functional groups within molecules. Microscopic imaging of FTIR is used for various practical applications, as it enables visualization of the composition distribution and changes in molecular structure without fluorescent labels. However, FTIR microscopy with an objective lens has a diffraction limit causing the low spatial resolution with the order of 10 $\mu$m. Here, we present high-spatial-resolution IR spectroscopy and imaging based on graphene micro-emitters, which have distinct features over conventional IR sources: a planar structure, bright intensity, a small footprint (sub $\mu$m$^2$), and high modulation speed of ~100 kHz. We performed IR absorption spectroscopy on a polymer thin film using graphene micro-emitters, realizing high-resolution IR imaging with a spatial resolution of ~2 $\mu$m, far higher than that of the conventional FTIR. We show the two-dimensional IR chemical imaging that visualizes the distribution of the chemical information, such as molecular species and functional groups. This technique can open new routes for novel IR imaging and microanalysis in material science, physics, chemistry, biology, and medicine.

Origins and consequences of asymmetric nano-FTIR interferograms

Rapid Infrared Spectroscopic Nanoimaging with nano-FTIR Holography

Detection and Signal Processing for Near-Field Nanoscale Fourier Transform Infrared Spectroscopy

Detection and Signal Processing for Near‐Field Nanoscale Fourier Transform Infrared Spectroscopy

Nanoscale-resolved chemical identification of thin organic films using infrared near-field spectroscopy and standard Fourier transform infrared references

Understanding the resolution and sensitivity in photothermal nanoscale chemical imaging - a point spread function approach

The origin of interferometric effect in scattering near-field scanning optical microscopy (presentation video)

Fourier transform infrared nano-spectroscopy: Mechanism and applications

Hyperspectral infrared nanoimaging of organic samples based on Fourier transform infrared nanospectroscopy

Subsurface chemical nanoidentification by nano-FTIR spectroscopy

Single-molecule spectromicroscopy: the door into sub-diffraction refractometry

Understanding AFM-IR Signal Dependence on Sample Thickness and Laser Excitation: Experimental and Theoretical Insights

AFM-IR: Technology and Applications in Nanoscale Infrared Spectroscopy and Chemical Imaging

Analysis of visible and infrared spectroscopic detection in scattering scanning near-field optical microscopy

Modelling photothermal induced resonance microscopy: the role of interface thermal resistances

Sub-Tip-Radius Near-Field Interactions in Nano-FTIR Vibrational Spectroscopy on Single Proteins

Performance of visible and mid-infrared scattering-type near-field optical microscopes

Near-field Optical Characterization of Low-Dimensional Nanomaterials

Performances for broadband synchrotron photothermal infrared nano-spectroscopy at Diamond Light Source

Resolving proximal nanometer objects below the diffraction limit with interferometric phase intensity nanoscopy

High resolution IR spectroscopy and imaging based on graphene micro emitters