Double Tips for In-Plane Polarized Near-Field Microscopy and Spectroscopy
Patryk Kusch,José Andrés Arcos Pareja,Aleksei Tsarapkin,Victor Deinhart,Karsten Harbauer,Katja Hoeflich,Stephanie Reich
DOI: https://doi.org/10.1021/acs.nanolett.4c02826
IF: 10.8
2024-09-11
Nano Letters
Abstract:Near-field optical microscopy and spectroscopy provide high-resolution imaging below the diffraction limit, crucial in physics, chemistry, and biology for studying molecules, nanoparticles, and viruses. These techniques use a sharp metallic tip of an atomic force microscope (AFM) to enhance incoming and scattered light by excited near-fields at the tip apex, leading to high sensitivity and a spatial resolution of a few nanometers. However, this restricts the near-field orientation to...
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology