Tip-enhanced Raman scattering microscope using quartz-tuning-fork AFM probe

A. Taguchi,S. Kawata,Kohta Saitoh
DOI: https://doi.org/10.1364/jsap.2017.6a_a410_4
2017-02-03
Abstract:Tip-enhanced Raman scattering (TERS) microscopy is one of the powerful scanning probe microscopy, which enables Raman analysis at nanoscale beyond the diffraction limit of light [1]. Applications by using TERS microscopy to a variety of samples, such as carbon materials, semiconductors and bio-molecules, have been reported. Typically, the distance between the metal tip and samples are con-trolled by contact-mode atomic force microscopy (AFM) to obtain the sufficient Raman enhancement in a moderate exposure time. However, the contact-mode AFM can limit the range of applications. It is difficult to measure samples which are soft or unfixed on a glass substrate, because the tip can damage or drag the sample. Moreover, a laser beam which is used to detect a cantilever deflection can interfere with Raman measurements in visible wavelengths. We believe that the introduction of advanced AFMs can expand the applications and contribute to commercialization.
Engineering,Materials Science,Physics
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