Detection Of Carbon Nanotubes Using Tip-Enhanced Raman Spectroscopy
Jia Wang,Xiaobin Wu,Rui Wang,Mingqian Zhang
DOI: https://doi.org/10.5772/17325
2011-01-01
Abstract:As a kind of new nano-materials, carbon nanotubes (CNTs) are of the particular properties, in the aspects of physics, mechanics, electronics, optics and so on. They indicate the remarkable potential applications in the nano-electronic devices, composite materials, scanning probe microscopy (SPM), field emission, hydrogen storage and environment protection. The research on CNTs has become a hot spot in the fields of nano-science and nano-technology, especially in nano-materials (Iijima, 1991; Yu et al., 2000; Frank et al., 1998; Chiang et al., 2001). The commonly used methods for the measurement and characterization of CNTs include the scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning probe microscopy (SPM), Raman spectroscopy, infrared spectroscopy and so on. Electron microscopy and SPM are commonly used in nowadays research on nano-science. And both of them provide direct characterization of the topography and nano-structure of CNTs with comparatively high spatial resolution. However, they fail to provide the corresponding specimens' chemical information, which is also required in the research and identifications of nano-materials and nano-structures. Raman spectroscopy is one of the spectral analysis methods used to detect vibrational, rotational, and other low-frequency modes information of the specimen structures or molecular structures, and is usually employed to obtain the structural information of CNTs (Rao et al., 1997; Dresselhaus et al., 2002; Dresselhaus et al., 2005). However, this spectral method is subject to two obstacles. One is the diffraction-limited spatial resolution, and the other is its inherent small Raman cross section and weak signal. As facing the challenges of nano-scale measurement, a new characterization method, which can simultaneously obtain topography characteristics with nanometer resolution and spectral information from nanometer localized specimen surface is desiderated. Tip-Enhanced Raman Spectroscopy (TERS) is an emerging technology developed to realize the aim mentioned above in the recent years (Stöckle et al, 2000; Hayazawa et al., 2000; Hartschuh et al., 2003; Pettinger et al., 2004). It spans the main obstacles of conventional Raman spectroscopy by tactfully combining the near-field optics advantage of nanometric spatial resolution and spectroscopy of obtaining chemical information. Also the Raman signal from nanometer localized specimen surface is considerably enhanced with the tipenhanced optical technology (TEOT) and the signal-to-noise ratio (SNR) is consequently