Overestimation of Operational Stability in Polymer-Based Organic Field-Effect Transistors Caused by Contact Resistance

Kenji Sakamoto,Takeshi Yasuda,Takeo Minari,Masafumi Yoshio,Junpei Kuwabara,Masayuki Takeuchi
DOI: https://doi.org/10.1021/acsami.4c15666
IF: 9.5
2024-12-02
ACS Applied Materials & Interfaces
Abstract:The bias-stress effects of bottom-gate top-contact polymer-based organic field-effect transistors (OFETs) with different channel lengths (50-500 μm) were evaluated by repeating cycles of prolonged on-state gate-bias application and transfer characteristics measurements in the linear regime. The thicknesses of poly(didodecylquaterthiophene-alt-didodecylbithiazole) active layers were 26 and 37 nm. All OFETs exhibited nonlinear (nonideal) transfer characteristics with a maximum transconductance...
materials science, multidisciplinary,nanoscience & nanotechnology
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