Abstract:Thermoelectric materials have attracted extensive attentions due to their extensive applications in thermoelectric refrigeration, waste heat recovery, aerospace and other fields. The effective improvement of thermoelectric properties of thermoelectric materials is of far-reaching significance to broaden their applications. One of the important methods is to improve thermoelectric performance by low dimension and nano-crystallization. Even though small-scale measurement is difficult to conduct, it is very important to accurately measure the thermoelectric properties for micro/nano thermoelectric materials. At present, different methods are used to measure the thermal and electrical parameters. However, using different methods to measure thermoelectric parameters will make measurement error transmission, resulting in large final ZT error. Moreover, transferring samples multiple times during separate measurements for different physical properties can result in impaired surface appearance of microscale samples, thus affecting their intrinsic physical properties. In addition, due to the remarkable difference between the individual samples, it is better to measure all the properties from the same individual sample. Therefore, it is necessary to study the in-suit integrated measurement method. This review summarizes the measurement methods of thermoelectric properties of micro/nano thermoelectric materials, including thermal conductivity, Seebeck coefficient and electrical conductivity. The existing integrated measurement methods of thermoelectric properties for part of micro/nano thermoelectric materials are also summarized. Finally, the difficulties of the integrated measurement methods are proposed and some strategies of the integrated measurement methods which are suitable for one-dimensional nanotubes and two-dimensional films are also prospected.

Accelerated measurement of electrical resistivity and Seebeck coefficient for thin-layer thermoelectric materials

A Fast and Efficient Method for Permittivity Measurement of Thin‐film Material

High Throughput Screening Tools for Thermoelectric Materials

Measurement of non-equilibrium characteristics of thermoelectric materials

A Setup for Measuring the Seebeck Coefficient and the Electrical Resistivity of Bulk Thermoelectric Materials

Dynamic Thermal Response Characteristics and Feasibility Analysis of Thermoelectric Module in Impedance Measurement

Simultaneous Measurement of Thermal Conductivity, Heat Capacity, and Interfacial Thermal Conductance by Leveraging Negative Delay-Time Data in Time-Domain Thermoreflectance

Simultaneous thermal conductivity and specific heat measurements of thin samples by transient Joule self-heating

Self-contained calibration samples and measurements of the thermoelectric figure of merit: A method to improve accuracy

An in-situ thermoelectric measurement apparatus inside a thermal-evaporator

Virtual instrumentation based automatic thin film resistivity measurement system

High-throughput imaging measurements of thermoelectric figure of merit

Simultaneous Measurement of Thermal Conductivity and Volumetric Heat Capacity of Thermal Interface Materials Using Thermoreflectance

Contributed Review: Instruments For Measuring Seebeck Coefficient Of Thin Film Thermoelectric Materials: A Mini-Review

Fast Seebeck Coefficient Measurement Based on Dynamic Method.

High‐throughput Strategies in The Discovery of Thermoelectric Materials

Automated Instrumentation for the Determination of the High-Temperature Thermoelectric Figure-of-Merit

Measurement Techniques for Thermal Conductivity and Interfacial Thermal Conductance of Bulk and Thin Film Materials

A Transient Method for Testing Thermoelectric Coolers

Progress in measurement of thermoelectric properties of micro/nano thermoelectric materials: A critical review

Cu3ErTe3: a New Promising Thermoelectric Material Predicated by High-Throughput Screening