Field-Effect Transistors Based on Two-dimensional Materials (Invited)

Keshari Nandan,Ateeb Naseer,Yogesh S. Chauhan
DOI: https://doi.org/10.1007/s41403-022-00379-3
2022-11-21
Abstract:In the quest for ultra-low-power electronics and integrating more and more functionality in an integrated circuit (IC), the semiconductor industry has entered the sub-3 nm node. A fin field-effect transistor (FinFET) was introduced by Intel at 22-nm technology node and looked promising down to 5-nm node. However, there is little room for scaling the Si fin from any three sides without degrading the carrier transport due to increased surface roughness. Hence, there is a need for channel materials that do not suffer from surface roughness scattering at nanoscale thickness. In this context, low-dimensional semiconductors, primarily two-dimensional (2-D), are potential candidates because they have dangling bond-free interfaces. 2-D materials also provide better electrostatics, thanks to their atomic-scale thickness. In recent years, the unique electronic properties of these materials have facilitated many novel nanoelectronics device concepts with experimental demonstration. Here, the state-of-the-art method to assess the intrinsic performance of FETs, comprised of 2-D semiconductor materials, is presented. Also, a charge-based compact model for drain current in 2-D FETs is systematically presented with ideal and real device effects owing to its importance in technology development and IC design. The model is verified against the simulated and experimental data of the single-layer (SL) transition-metal dichalcogenides (TMDs) channel material-based FETs.
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