Growth, magnetic, and electronic properties of Ni-Zn ferrites thin films

Luis Gabriel Guzman,Luis Carlos Sánchez,Johanna Gil Monsalve,Carlos Ostos,Oscar Arnache
DOI: https://doi.org/10.1088/2053-1591/ad78ae
IF: 2.025
2024-09-11
Materials Research Express
Abstract:Thin films of Ni-Zn ferrite grown on MgO(111) single crystal substrate were prepared using radiofrequency magnetron sputtering, with a target of nominal composition Ni 0.5 Zn 0.5 Fe 2 O 4 . Subsequently, X-ray diffraction (XRD) was performed, which revealed characteristic reflections of a Ni-Zn ferrite structure, confirming the unique formation of the ferrite. X-ray photoelectron spectroscopy (XPS) revealed the presence of metal ions in their appropriate valence states within the crystalline structure of the Ni-Zn ferrite. The variation in binding energy observed in the thin film is attributed to changes in the environment of Fe 3+ and Zn 2+ or Ni 2+ ions, resulting from the non-equilibrium distribution of cations in tetrahedral and octahedral sites. The saturation magnetization and the coercivity field were 7.05 μB/cell and 513 ± 32 Oe, respectively. In addition, ferromagnetic resonance studies were made using broad-band FMR spectroscopy based on a coplanar waveguide (CPW) spectrometer.
materials science, multidisciplinary
What problem does this paper attempt to address?