A Dual-Drain Vertical Tunnel FET with Improved Device Performance: Proposal, Optimization, and Investigation

Diganta Das,Chandan kumar Pandey
DOI: https://doi.org/10.1149/2162-8777/aca9fc
IF: 2.2
2022-12-10
ECS Journal of Solid State Science and Technology
Abstract:A novel dual-drain Vertical TFET is proposed and investigated for the first time. The simulation outcomes show that reduction in channel thickness, which has an inadequate impact on tunneling region, significantly improves DC parameters including SSavg, ION, and ION/IOFF by enhancing band-to-band tunneling of charge carriers at source/channel interface caused by enlarged electric field. In order to make proposed device suitable for low power applications, dielectric material is incorporated in between two drain/channel interfaces to reduce leakage current. A detailed investigation is carried out to determine the influence of varying device footprints on various electrical parameters and, accordingly, the optimized device performance is achieved. TCAD-based simulation results reveal that low SSavg of 18mV/decade along with high ION/IOFF of 1.6×〖10〗^13 can be achieved with optimum geometric dimension of gate-oxide, source, and channel. Further, performance of the proposed device is compared with various existing TFET structures and found to be superior in terms of ION/IOFF, SSavg, and turn-on voltage. The probable fabrication process flow is also discussed for a proposed device and based on the proper benchmarking, it is revealed that improvement in parameters defining the switching characteristics of an inverter makes the proposed device more suitable for digital circuit-based applications.
materials science, multidisciplinary,physics, applied
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