New experimental device for high-temperature normal spectral emissivity measurements of coatings

Petra Honnerová,Jiří Martan,Martin Kučera,Milan Honner,Jacques Hameury
DOI: https://doi.org/10.1088/0957-0233/25/9/095501
IF: 2.398
2014-08-04
Measurement Science and Technology
Abstract:A new experimental device for normal spectral emissivity measurements of coatings in the infrared spectral range from 1.38 μm to 26 μm and in the temperature range from 550 K to 1250 K is presented. A Fourier transform infrared spectrometer (FTIR) is used for the detection of sample and blackbody spectral radiation. Sample heating is achieved by a fiber laser with a scanning head. Surface temperature is measured by two methods. The first method uses an infrared camera and a reference coating with known effective emissivity, the second method is based on the combination of Christiansen wavelength with contact and noncontact surface temperature measurement. Application of the method is shown on the example of a high-temperature high-emissivity coating. Experimental results obtained with this apparatus are compared with the results performed by a direct method of Laboratoire National d’Essais (LNE) in France. The differences in the spectra are analyzed.
engineering, multidisciplinary,instruments & instrumentation
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